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FH00400 - SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products
SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products Sale priceFrom $193.00 USD
D08600 - SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays
SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV10100 - SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building
SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building Sale priceMember Price: $148.00
Non-Member Price: $193.00
FH00200 - SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles
SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles Sale priceMember Price: $148.00
Non-Member Price: $193.00
FH00100 - SEMI FH1 - Test Method of Line Impedance for Electronic Textiles
SEMI FH1 - Test Method of Line Impedance for Electronic Textiles Sale priceMember Price: $148.00
Non-Member Price: $193.00
G10200 - SEMI G102 - Specification for Shear Strength of Encapsulation Materials for Wafer Level Packaging and Panel Level Packaging
SEMI G102 - Specification for Shear Strength of Encapsulation Materials for Wafer Level Packaging and Panel Level Packaging Sale priceMember Price: $148.00
Non-Member Price: $193.00
C10400 - SEMI C104 - Guide for Reporting Performance Parameters of the Polymer Windows for Chemical Mechanical Planarization (CMP) Pads Used in Semiconductor Manufacturing
SEMI C104 - Guide for Reporting Performance Parameters of the Polymer Windows for Chemical Mechanical Planarization (CMP) Pads Used in Semiconductor Manufacturing Sale priceMember Price: $148.00
Non-Member Price: $193.00
E18000 - SEMI E180 - 通过ICP-MS测量半导体晶圆加工过程中关键腔室部件表面金属污染的试验方法
SEMI E180 - 通过ICP-MS测量半导体晶圆加工过程中关键腔室部件表面金属污染的试验方法 Sale priceMember Price: $148.00
Non-Member Price: $193.00
F11800 - SEMI F118 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components
SEMI F118 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components Sale priceMember Price: $148.00
Non-Member Price: $193.00
F11700 - SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems
SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
C10300 - SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing
SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing Sale priceMember Price: $148.00
Non-Member Price: $193.00
C10100 - SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: $148.00
Non-Member Price: $193.00
D07900 - SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays
SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09800 - SEMI PV99 - Classification of Building Integrated Photovoltaic (BIPV)
SEMI PV99 - Classification of Building Integrated Photovoltaic (BIPV) Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09700 - SEMI PV97 - Specification for Silicon Powder Used in Polysilicon Production
SEMI PV97 - Specification for Silicon Powder Used in Polysilicon Production Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09300 - SEMI PV93 - Test Method for Accelerated Cell Level Testing for Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility of Solar Cells
SEMI PV93 - Test Method for Accelerated Cell Level Testing for Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility of Solar Cells Sale priceMember Price: $148.00
Non-Member Price: $193.00
C09900 - SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: $148.00
Non-Member Price: $193.00
E17800 - SEMI E178 - Guide for EDA Freeze Version
SEMI E178 - Guide for EDA Freeze Version Sale price Member Price : $148.00
3D02200 - SEMI 3D22 - Guide on Measurements of Openings and Vias in Glass
SEMI 3D22 - Guide on Measurements of Openings and Vias in Glass Sale priceMember Price: $148.00
Non-Member Price: $193.00
MS00800 - SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages
SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages Regular price$300.00 USD Sale price$193.00 USD
MS01100 - SEMI MS11 - Specification for Microfluidic Port and Pitch Dimensions
SEMI MS11 - Specification for Microfluidic Port and Pitch Dimensions Sale priceMember Price: $148.00
Non-Member Price: $193.00
S00300 - SEMI S3 - 製程液體加熱系統安全基準
SEMI S3 - 製程液體加熱系統安全基準 Sale priceMember Price: $148.00
Non-Member Price: $193.00
S01200 - SEMI S12 - 装置の汚染除去に対する環境，健康および安全ガイドライン
SEMI S12 - 装置の汚染除去に対する環境，健康および安全ガイドライン Sale priceMember Price: $176.00
Non-Member Price: $231.00
T00800 - SEMI T8 - Specification for Marking of Glass Flat Panel Display Substrates with a Two-Dimensional Matrix Code Symbol
SEMI T8 - Specification for Marking of Glass Flat Panel Display Substrates with a Two-Dimensional Matrix Code Symbol Sale priceMember Price: $148.00
Non-Member Price: $193.00
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