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F04100 - SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing
SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing Sale priceMember Price: $148.00
Non-Member Price: $193.00
F04300 - SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters
SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters Sale priceMember Price: $148.00
Non-Member Price: $193.00
E13300 - SEMI E133 - Specification for Automated Process Control Systems Interface
SEMI E133 - Specification for Automated Process Control Systems Interface Sale priceMember Price: $148.00
Non-Member Price: $193.00
E12300 - SEMI E123 - Specification for Handler Equipment Specific Equipment Model (HSEM)
SEMI E123 - Specification for Handler Equipment Specific Equipment Model (HSEM) Sale priceMember Price: $148.00
Non-Member Price: $193.00
C08900 - SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS)
SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS) Sale priceMember Price: $148.00
Non-Member Price: $193.00
T02700 - SEMI T27 - Specification for Traceability Identification Label of Component Parts
SEMI T27 - Specification for Traceability Identification Label of Component Parts Sale priceMember Price: $148.00
Non-Member Price: $193.00
M09300 - SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging
SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF002800 - SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF015400 - SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces Sale priceMember Price: $148.00
Non-Member Price: $193.00
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors
SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Sale priceMember Price: $148.00
Non-Member Price: $193.00
M04500 - SEMI M45 - Specification for 300 mm Wafer Shipping System
SEMI M45 - Specification for 300 mm Wafer Shipping System Sale priceMember Price: $148.00
Non-Member Price: $193.00
M04300 - SEMI M43 - Guide for Reporting Wafer Nanotopography
SEMI M43 - Guide for Reporting Wafer Nanotopography Sale priceMember Price: $148.00
Non-Member Price: $193.00
G07700 - SEMI G77 - Specification for Frame Cassette for 300 mm Wafers
SEMI G77 - Specification for Frame Cassette for 300 mm Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
G07400 - SEMI G74 - Specification for Tape Frame for 300 mm Wafers
SEMI G74 - Specification for Tape Frame for 300 mm Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
F11000 - SEMI F110 - Test Method for Mono-Dispersed Polystyrene Latex (PSL) Challenge of Liquid Filters
SEMI F110 - Test Method for Mono-Dispersed Polystyrene Latex (PSL) Challenge of Liquid Filters Sale priceMember Price: $148.00
Non-Member Price: $193.00
F03900 - SEMI F39 - Guide for Chemical Blending Systems
SEMI F39 - Guide for Chemical Blending Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
F05000 - SEMI F50 - Guide for Electric Utility Voltage Sag Performance for Semiconductor Factories
SEMI F50 - Guide for Electric Utility Voltage Sag Performance for Semiconductor Factories Sale priceMember Price: $148.00
Non-Member Price: $193.00
E17200 - SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD)
SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD) Sale price Member Price : $148.00
E14800 - SEMI E148 - Specification for Time Synchronization and Definition of the TS-Clock Object
SEMI E148 - Specification for Time Synchronization and Definition of the TS-Clock Object Sale priceMember Price: $148.00
Non-Member Price: $193.00
E13800 - SEMI E138 - Specification for XML Semiconductor Common Components
SEMI E138 - Specification for XML Semiconductor Common Components Sale priceMember Price: $148.00
Non-Member Price: $193.00
E12800 - SEMI E128 - Specification for XML Message Structures
SEMI E128 - Specification for XML Message Structures Sale priceMember Price: $148.00
Non-Member Price: $193.00
D03100 - SEMI D31 - Guide for Definition of Measurement Index (DSEMU) for Luminance Mura in FPD Image Quality Inspection
SEMI D31 - Guide for Definition of Measurement Index (DSEMU) for Luminance Mura in FPD Image Quality Inspection Sale price Member Price : $148.00
C09700 - SEMI C97 - Specification for Determination of Particle Levels of Gases Delivered as Pipeline Gas or by Pressurized Gas Cylinder
SEMI C97 - Specification for Determination of Particle Levels of Gases Delivered as Pipeline Gas or by Pressurized Gas Cylinder Sale priceMember Price: $148.00
Non-Member Price: $193.00
C08200 - SEMI C82 - Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter
SEMI C82 - Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter Sale priceMember Price: $148.00
Non-Member Price: $193.00
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