SEMIViews Impact

SEMIViews is an annual subscription-based product for online access to SEMI Standards. The portal allows password-protected access to over 1000 Standards, organisation of the most frequently used documents by selected, pre-arranged tabs, provides effortless navigation between Standards documents and a powerful search.

 

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1631 products

C00355 - SEMI C3.55 - シラン（SiH4），バルク，品質99.994%の仕様
SEMI C3.55 - シラン（SiH4），バルク，品質99.994%の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
C00347 - SEMI C3.47 - 臭化水素（HBr），品質99.98%の仕様
SEMI C3.47 - 臭化水素（HBr），品質99.98%の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
C00340 - SEMI C3.40 - 四フッ化炭素（CF4），99.997%品質の仕様
SEMI C3.40 - 四フッ化炭素（CF4），99.997%品質の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
C00339 - SEMI C3.39 - 三フッ化窒素（NF3）99.98%品質の仕様
SEMI C3.39 - 三フッ化窒素（NF3）99.98%品質の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
C00327 - SEMI C3.27 - 三フッ化ホウ素（BF3），シリンダ充填， 99.0%品質の仕様
SEMI C3.27 - 三フッ化ホウ素（BF3），シリンダ充填， 99.0%品質の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
C02900 - SEMI C29 - 4.9%フッ化ケイ素酸（10:1 V/V）の仕様とガイドライン
SEMI C29 - 4.9%フッ化ケイ素酸（10:1 V/V）の仕様とガイドライン Sale priceMember Price: $171.00
Non-Member Price: $224.00
C02800 - SEMI C28 - フッ化ケイ素酸の仕様
SEMI C28 - フッ化ケイ素酸の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
C02500 - SEMI C25 - Specification for Dichloromethane (Methylene Chloride)
SEMI C25 - Specification for Dichloromethane (Methylene Chloride) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C02100 - SEMI C21 - 水酸化アンモニウムの仕様とガイドライン
SEMI C21 - 水酸化アンモニウムの仕様とガイドライン Sale priceMember Price: $171.00
Non-Member Price: $224.00
C00100 - SEMI C1 - 液体化学薬品の分析のためのガイド
SEMI C1 - 液体化学薬品の分析のためのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
PV00400 - SEMI PV4 - Specification for Range of 5th Generation Substrate Sizes for Thin Film Photovoltaic Applications
SEMI PV4 - Specification for Range of 5th Generation Substrate Sizes for Thin Film Photovoltaic Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
P00800 - SEMI P8 - Test Method for the Determination of Water in Photoresist
SEMI P8 - Test Method for the Determination of Water in Photoresist Sale priceMember Price: $144.00
Non-Member Price: $187.00
P00700 - SEMI P7 - Test Method of Viscosity Determination, Method A - Kinematic Viscosity
SEMI P7 - Test Method of Viscosity Determination, Method A - Kinematic Viscosity Sale priceMember Price: $144.00
Non-Member Price: $187.00
P00600 - SEMI P6 - フォトマスク用レジストレーションマーク
SEMI P6 - フォトマスク用レジストレーションマーク Sale priceMember Price: $171.00
Non-Member Price: $224.00
P00600 - SEMI P6 - Specification for Registration Marks for Photomasks
SEMI P6 - Specification for Registration Marks for Photomasks Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04700 - SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness
SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04600 - SEMI P46 - Specification for Critical Dimension (CD) Measurement Information Data on Photomask by XML
SEMI P46 - Specification for Critical Dimension (CD) Measurement Information Data on Photomask by XML Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04300 - SEMI P43 - Photomask Qualification Terminology
SEMI P43 - Photomask Qualification Terminology Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04200 - SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様
SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P04200 - SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System
SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04100 - SEMI P41 - XMLによる，検査装置，修正装置およびレビュー装置間で取扱うマスク欠陥データ仕様
SEMI P41 - XMLによる，検査装置，修正装置およびレビュー装置間で取扱うマスク欠陥データ仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P04100 - SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools
SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools Sale priceMember Price: $144.00
Non-Member Price: $187.00
P03700 - SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks
SEMI P37 - Specification for Extreme Ultraviolet Lithography Substrates and Blanks Sale priceMember Price: $144.00
Non-Member Price: $187.00
P03500 - SEMI P35 - Terminology for Microlithography Metrology
SEMI P35 - Terminology for Microlithography Metrology Sale priceMember Price: $144.00
Non-Member Price: $187.00