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M03400 - SEMI M34 - SIMOXウェーハを規定するための指針
SEMI M34 - SIMOXウェーハを規定するための指針 Sale priceMember Price: $171.00
Non-Member Price: $180.00
M03500 - SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection
M03500 - SEMI M35 - 自動検査により検出されるシリコンウェーハ表面特性の仕様を開発するためのガイド
M03600 - SEMI M36 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Gallium Arsenide Wafers
M03600 - SEMI M36 - 低転位密度GaAs基板のエッチピット密度(EPD)測定方法
SEMI M36 - 低転位密度GaAs基板のエッチピット密度(EPD)測定方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
M03700 - SEMI M37 - 低転位密度Inp基板のエッチピット密度(EPD)測定方法
SEMI M37 - 低転位密度Inp基板のエッチピット密度(EPD)測定方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers
SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M03800 - SEMI M38 - 鏡面リクレイムシリコンウェーハの仕様
M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals
M03900 - SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法
M04000 - SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers
SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04000 - SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド
SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M04100 - SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs
SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04100 - SEMI M41 - 電源デバイス/IC用シリコン・オン・インシュレーター(SOI)の仕様
M04200 - SEMI M42 - Specification for Compound Semiconductor Epitaxial Wafers
SEMI M42 - Specification for Compound Semiconductor Epitaxial Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04200 - SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様
SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M04300 - SEMI M43 - Guide for Reporting Wafer Nanotopography
SEMI M43 - Guide for Reporting Wafer Nanotopography Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04300 - SEMI M43 - ウェーハナノポトグラフィを報告するためのガイド
SEMI M43 - ウェーハナノポトグラフィを報告するためのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M04400 - SEMI M44 - Guide to Conversion Factors for Interstitial Oxygen in Silicon
SEMI M44 - Guide to Conversion Factors for Interstitial Oxygen in Silicon Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04400 - SEMI M44 - シリコン中の酸素の換算係数ガイド
SEMI M44 - シリコン中の酸素の換算係数ガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M04500 - SEMI M45 - 300 mmウェーハシッピングシステムに関する暫定仕様
M04500 - SEMI M45 - Specification for 300 mm Wafer Shipping System
SEMI M45 - Specification for 300 mm Wafer Shipping System Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04600 - SEMI M46 - ECV法によりエピタキシァル層内のキャリア密度プロファイルを測定するための試験方法