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E07000 - SEMI E70 - Guide for Tool Accommodation Process
SEMI E70 - Guide for Tool Accommodation Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
E05420 - SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT®
SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT® Sale priceMember Price: $144.00
Non-Member Price: $187.00
E02800 - SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller
SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17200 - SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD)
SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD) Sale price Member Price : $144.00
E01600 - SEMI E16 - Guide for Determining and Describing Mass Flow Controller Leak Rates
SEMI E16 - Guide for Determining and Describing Mass Flow Controller Leak Rates Sale priceMember Price: $144.00
Non-Member Price: $187.00
E11300 - SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems
SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07800 - SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices
SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07500 - SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display
SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display Sale priceMember Price: $144.00
Non-Member Price: $187.00
D05700 - SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection
SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection Sale priceMember Price: $144.00
Non-Member Price: $187.00
C09600 - SEMI C96 - Test Method for Determining Density of Chemical Mechanical Planarization (CMP) Slurries
SEMI C96 - Test Method for Determining Density of Chemical Mechanical Planarization (CMP) Slurries Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08200 - SEMI C82 - Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter
SEMI C82 - Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D00500 - SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures
SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19400 - SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons
SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19200 - SEMI E192 - Guide for Equipment Adoption Criteria for GEM and GEM-related Standards
SEMI E192 - Guide for Equipment Adoption Criteria for GEM and GEM-related Standards Sale priceMember Price: $144.00
Non-Member Price: $187.00
F12200 - SEMI F122 - Guide for Facilities Data Package for Manufacturing Equipment Installation and Building Information Modeling
SEMI F122 - Guide for Facilities Data Package for Manufacturing Equipment Installation and Building Information Modeling Sale priceMember Price: $144.00
Non-Member Price: $187.00
FH00400 - SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products
SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products Sale priceFrom $187.00 USD
D08600 - SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays
SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV10100 - SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building
SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building Sale priceMember Price: $144.00
Non-Member Price: $187.00
FH00200 - SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles
SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles Sale priceMember Price: $144.00
Non-Member Price: $187.00
FH00100 - SEMI FH1 - Test Method of Line Impedance for Electronic Textiles
SEMI FH1 - Test Method of Line Impedance for Electronic Textiles Sale priceMember Price: $144.00
Non-Member Price: $187.00
T02400 - SEMI T24 - Specification for ID Marking for Glass Carrier Characteristics of Panel Level Packaging (PLP) Applications
SEMI T24 - Specification for ID Marking for Glass Carrier Characteristics of Panel Level Packaging (PLP) Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
G10200 - SEMI G102 - Specification for Shear Strength of Encapsulation Materials for Wafer Level Packaging and Panel Level Packaging
SEMI G102 - Specification for Shear Strength of Encapsulation Materials for Wafer Level Packaging and Panel Level Packaging Sale priceMember Price: $144.00
Non-Member Price: $187.00
F11700 - SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems
SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
C10200 - SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing
SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00