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C08700 - SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry
SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
C05800 - SEMI C58 - Specification for Hydrogen
SEMI C58 - Specification for Hydrogen Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00334 - SEMI C3.34 - Specification for Disilane (Si2H6) in Cylinders, 97% Quality
SEMI C3.34 - Specification for Disilane (Si2H6) in Cylinders, 97% Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00320 - SEMI C3.20 - Specification for Helium (He), in Cylinders, 99.9995%
SEMI C3.20 - Specification for Helium (He), in Cylinders, 99.9995% Sale priceMember Price: $144.00
Non-Member Price: $187.00
C01000 - SEMI C10 - MDL（定量下限値）決定に関するガイド
SEMI C10 - MDL（定量下限値）決定に関するガイド Sale priceMember Price: $334.00
Non-Member Price: $444.00
3D01700 - SEMI 3D17 - Specification for Reference Material for Bonded Wafer Stack Void Metrology
SEMI 3D17 - Specification for Reference Material for Bonded Wafer Stack Void Metrology Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D01300 - SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks
SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D01200 - SEMI 3D12 - Guide for Measuring Flatness and Shape of Low Stiffness Wafers
SEMI 3D12 - Guide for Measuring Flatness and Shape of Low Stiffness Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M09400 - SEMI M94 - Specification for Silicon Carbide Engineered Substrates
SEMI M94 - Specification for Silicon Carbide Engineered Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19300 - SEMI E193 - Specification for 300 mm Film Frame FOUP (FFF)
SEMI E193 - Specification for 300 mm Film Frame FOUP (FFF) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19001 - SEMI E190.1 - Specification for Common Data for Etch Components
SEMI E190.1 - Specification for Common Data for Etch Components Sale priceMember Price: $144.00
Non-Member Price: $187.00
C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA)
SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E18600 - SEMI E186 - Specification for Location and Dimensions for Power Connectors and Ethercat Ports in Mass Flow Controllers and Mass Flow Meters
SEMI E186 - Specification for Location and Dimensions for Power Connectors and Ethercat Ports in Mass Flow Controllers and Mass Flow Meters Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D02200 - SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications
SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS01300 - SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process
SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV09400 - SEMI PV94 - Guide for Identifying Cell Defects In Crystalline Silicon Photovoltaic (PV) Modules By Electroluminescence (EL) Imaging
SEMI PV94 - Guide for Identifying Cell Defects In Crystalline Silicon Photovoltaic (PV) Modules By Electroluminescence (EL) Imaging Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D02100 - SEMI 3D21 - Guide for Describing Glass-Based Material for Use in 3DS-IC Process
SEMI 3D21 - Guide for Describing Glass-Based Material for Use in 3DS-IC Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01800 - SEMI S18 - 矽烷族氣體處理之安全衛生及環保基準
SEMI S18 - 矽烷族氣體處理之安全衛生及環保基準 Sale priceMember Price: $144.00
Non-Member Price: $187.00
T00900 - SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol
SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01700 - SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン
SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン Sale priceMember Price: $171.00
Non-Member Price: $224.00
PV07600 - SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)
SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC) Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV07500 - SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials
SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV05400 - SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells
SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV05100 - SEMI PV51 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence
SEMI PV51 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence Sale priceMember Price: $144.00
Non-Member Price: $187.00