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MF139100 - SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption
SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption Sale priceMember Price: $144.00
Non-Member Price: $187.00
M08300 - SEMI M83 - Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V Compound Semiconductors
SEMI M83 - Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V Compound Semiconductors Sale priceMember Price: $144.00
Non-Member Price: $187.00
M06200 - SEMI M62 - Specification for Silicon Epitaxial Wafers
SEMI M62 - Specification for Silicon Epitaxial Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G06900 - SEMI G69 - Test Method for Measurement of Adhesive Strength Between Leadframes and Molding Compounds
SEMI G69 - Test Method for Measurement of Adhesive Strength Between Leadframes and Molding Compounds Sale priceMember Price: $144.00
Non-Member Price: $187.00
F11000 - SEMI F110 - Test Method for Mono-Dispersed Polystyrene Latex (PSL) Challenge of Liquid Filters
SEMI F110 - Test Method for Mono-Dispersed Polystyrene Latex (PSL) Challenge of Liquid Filters Sale priceMember Price: $144.00
Non-Member Price: $187.00
F06800 - SEMI F68 - Test Method for Determining Purifier Efficiency
SEMI F68 - Test Method for Determining Purifier Efficiency Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05900 - SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves
SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves Sale priceMember Price: $144.00
Non-Member Price: $187.00
E07800 - SEMI E78 - 装置のための静電気放電（ESD）と静電気吸着（ESA）の評価と管理へのガイド
SEMI E78 - 装置のための静電気放電（ESD）と静電気吸着（ESA）の評価と管理へのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
E03005 - SEMI E30.5 - Specification for Metrology Specific Equipment Model (MSEM)
SEMI E30.5 - Specification for Metrology Specific Equipment Model (MSEM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E15700 - SEMI E157 - Specification for Module Process TrackingE15700 - SEMI E157 - Specification for Module Process Tracking
SEMI E157 - Specification for Module Process Tracking Sale priceMember Price: $144.00
Non-Member Price: $187.00
E13500 - SEMI E135 - Test Method for RF Generators to Determine Transient Response for RF Power Delivery Systems Used in Semiconductor Processing Equipment
SEMI E135 - Test Method for RF Generators to Determine Transient Response for RF Power Delivery Systems Used in Semiconductor Processing Equipment Sale priceMember Price: $144.00
Non-Member Price: $187.00
E12200 - SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM)
SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E10900 - SEMI E109 - Specification for Reticle and Pod Management (RPMS)
SEMI E109 - Specification for Reticle and Pod Management (RPMS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
D06100 - SEMI D61 - Test Method of Perceptual Angle for OLED Displays
SEMI D61 - Test Method of Perceptual Angle for OLED Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08900 - SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS)
SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C07700 - SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm
SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm Sale priceMember Price: $144.00
Non-Member Price: $187.00
C05600 - SEMI C56 - Specification for Dichlorosilane (SiH2Cl2)
SEMI C56 - Specification for Dichlorosilane (SiH2Cl2) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C03600 - SEMI C36 - Specification for Phosphoric Acid
SEMI C36 - Specification for Phosphoric Acid Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D00700 - SEMI 3D7 - Guide for Alignment Mark for 3DS-IC Process
SEMI 3D7 - Guide for Alignment Mark for 3DS-IC Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
F12000 - SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems
SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17900 - SEMI E179 - Specification for Protocol Buffers Common Components
SEMI E179 - Specification for Protocol Buffers Common Components Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS01200 - SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices
SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17700 - SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows
SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS00500 - SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures
SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures Sale priceMember Price: $144.00
Non-Member Price: $187.00