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M08500 - SEMI M85 - Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry
SEMI M85 - Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04000 - SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers
SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19100 - SEMI E191 - Specification for Computing Device Cybersecurity Status Reporting
SEMI E191 - Specification for Computing Device Cybersecurity Status Reporting Sale priceMember Price: $278.00
Non-Member Price: $369.00
M09300 - SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging
SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging Sale priceMember Price: $144.00
Non-Member Price: $187.00
F11500 - SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components
SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components Sale priceMember Price: $144.00
Non-Member Price: $187.00
E03700 - SEMI E37 - 高速SECSメッセージサービス（HSMS）汎用サービス
SEMI E37 - 高速SECSメッセージサービス（HSMS）汎用サービス Sale priceMember Price: $334.00
Non-Member Price: $444.00
T01000 - SEMI T10 - Test Method for the Assessment of 2D Data Matrix Direct Mark Quality
SEMI T10 - Test Method for the Assessment of 2D Data Matrix Direct Mark Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge
SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge Sale priceMember Price: $144.00
Non-Member Price: $187.00
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors
SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07300 - SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles
SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04500 - SEMI M45 - Specification for 300 mm Wafer Shipping System
SEMI M45 - Specification for 300 mm Wafer Shipping System Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07400 - SEMI G74 - Specification for Tape Frame for 300 mm Wafers
SEMI G74 - Specification for Tape Frame for 300 mm Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F03900 - SEMI F39 - Guide for Chemical Blending Systems
SEMI F39 - Guide for Chemical Blending Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
F04300 - SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters
SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters Sale priceMember Price: $144.00
Non-Member Price: $187.00
F03200 - SEMI F32 - Test Method for Determination of Flow Coefficient for High Purity Shutoff Valves
SEMI F32 - Test Method for Determination of Flow Coefficient for High Purity Shutoff Valves Sale priceMember Price: $144.00
Non-Member Price: $187.00
E09400 - SEMI E94 - 컨트롤 잡 관리 사양
SEMI E94 - 컨트롤 잡 관리 사양 Sale priceMember Price: $144.00
Non-Member Price: $187.00
E13800 - SEMI E138 - Specification for XML Semiconductor Common Components
SEMI E138 - Specification for XML Semiconductor Common Components Sale priceMember Price: $144.00
Non-Member Price: $187.00
E13300 - SEMI E133 - Specification for Automated Process Control Systems Interface
SEMI E133 - Specification for Automated Process Control Systems Interface Sale priceMember Price: $144.00
Non-Member Price: $187.00
C09700 - SEMI C97 - Specification for Determination of Particle Levels of Gases Delivered as Pipeline Gas or by Pressurized Gas Cylinder
SEMI C97 - Specification for Determination of Particle Levels of Gases Delivered as Pipeline Gas or by Pressurized Gas Cylinder Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS01400 - SEMI MS14 - Guide for Critical Parameters of Gas Sensors
SEMI MS14 - Guide for Critical Parameters of Gas Sensors Sale priceMember Price: $144.00
Non-Member Price: $187.00
M00100 - SEMI M1 - 鏡面単結晶シリコンウェーハの仕様
SEMI M1 - 鏡面単結晶シリコンウェーハの仕様 Sale priceMember Price: $334.00
Non-Member Price: $444.00
T01900 - SEMI T19 - Specification for Device Marking
SEMI T19 - Specification for Device Marking Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF092800 - SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF198200 - SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography
SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography Sale priceMember Price: $144.00
Non-Member Price: $187.00