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MF198200 - SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography
SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF015400 - SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces Sale priceMember Price: $144.00
Non-Member Price: $187.00
M00900 - SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers
SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04300 - SEMI M43 - Guide for Reporting Wafer Nanotopography
SEMI M43 - Guide for Reporting Wafer Nanotopography Sale priceMember Price: $144.00
Non-Member Price: $187.00
M02000 - SEMI M20 - Practice for Establishing a Wafer Coordinate System
SEMI M20 - Practice for Establishing a Wafer Coordinate System Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07700 - SEMI G77 - Specification for Frame Cassette for 300 mm Wafers
SEMI G77 - Specification for Frame Cassette for 300 mm Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G09600 - SEMI G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending
SEMI G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending Sale priceMember Price: $144.00
Non-Member Price: $187.00
F03400 - SEMI F34 - Guide for Liquid Chemical Pipe Labeling
SEMI F34 - Guide for Liquid Chemical Pipe Labeling Sale priceMember Price: $144.00
Non-Member Price: $187.00
F04100 - SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing
SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05000 - SEMI F50 - Guide for Electric Utility Voltage Sag Performance for Semiconductor Factories
SEMI F50 - Guide for Electric Utility Voltage Sag Performance for Semiconductor Factories Sale priceMember Price: $144.00
Non-Member Price: $187.00
E07600 - SEMI E76 - Guide for 300 mm Process Equipment Points of Connection to Facility Services
SEMI E76 - Guide for 300 mm Process Equipment Points of Connection to Facility Services Sale priceMember Price: $144.00
Non-Member Price: $187.00
E06600 - SEMI E66 - Test Method for Determining Particle Contribution by Mass Flow Controllers
SEMI E66 - Test Method for Determining Particle Contribution by Mass Flow Controllers Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17500 - SEMI E175 - Specification for Subsystem Energy Saving Mode Communication (SESMC)
SEMI E175 - Specification for Subsystem Energy Saving Mode Communication (SESMC) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E12800 - SEMI E128 - Specification for XML Message Structures
SEMI E128 - Specification for XML Message Structures Sale priceMember Price: $144.00
Non-Member Price: $187.00
D03100 - SEMI D31 - Guide for Definition of Measurement Index (DSEMU) for Luminance Mura in FPD Image Quality Inspection
SEMI D31 - Guide for Definition of Measurement Index (DSEMU) for Luminance Mura in FPD Image Quality Inspection Sale price Member Price : $144.00
C00355 - SEMI C3.55 - Specification for Silane (SiH4), Bulk, 99.994% Quality
SEMI C3.55 - Specification for Silane (SiH4), Bulk, 99.994% Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D01600 - SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging
SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D00200 - SEMI 3D2 - Specification for Glass Carrier Wafers for 3DS-IC Applications
SEMI 3D2 - Specification for Glass Carrier Wafers for 3DS-IC Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
S00800 - SEMI S8 - 半導體製造設備人因工程之安全基準
SEMI S8 - 半導體製造設備人因工程之安全基準 Sale priceMember Price: $278.00
Non-Member Price: $369.00
PV04900 - SEMI PV49 - Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells by Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry
SEMI PV49 - Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells by Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV00300 - SEMI PV3 - Guide for High Purity Water Used in Photovoltaic Cell Processing
SEMI PV3 - Guide for High Purity Water Used in Photovoltaic Cell Processing Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV01700 - SEMI PV17 - Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications
SEMI PV17 - Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV01300 - SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF004300 - SEMI MF43 - Test Method for Resistivity of Semiconductor Materials
SEMI MF43 - Test Method for Resistivity of Semiconductor Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00