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E00400 - SEMI E4 - 半導体製造装置通信スタンダード1　メッセージトランスファ（SECS-I）
SEMI E4 - 半導体製造装置通信スタンダード1　メッセージトランスファ（SECS-I） Sale priceMember Price: $171.00
Non-Member Price: $224.00
S02200 - SEMI S22 - 半導體製造設備電氣設計安全基準
SEMI S22 - 半導體製造設備電氣設計安全基準 Sale price Member Price : $144.00
PV08900 - SEMI PV89 - Test Method of Current-Voltage (I-V) Measurement in Indoor Lighting for Dye-Sensitized Solar Cell and Organic Photovoltaic and Perovskite Solar Cell (PSC)
SEMI PV89 - Test Method of Current-Voltage (I-V) Measurement in Indoor Lighting for Dye-Sensitized Solar Cell and Organic Photovoltaic and Perovskite Solar Cell (PSC) Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV00900 - SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse
SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV05700 - SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)
SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC) Sale price Member Price : $144.00
PV0036 - SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications
SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV01900 - SEMI PV19 - Guide for Testing Photovoltaic Connector Ribbon Characteristics
SEMI PV19 - Guide for Testing Photovoltaic Connector Ribbon Characteristics Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV01800 - SEMI PV18 - Guide for Specifying a Photovoltaic Connector Ribbon
SEMI PV18 - Guide for Specifying a Photovoltaic Connector Ribbon Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV00100 - SEMI PV1 - Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry
SEMI PV1 - Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04800 - SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank
SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers
SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M00800 - SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers
SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07100 - SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI
SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI Sale priceMember Price: $144.00
Non-Member Price: $187.00
M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers
SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F03000 - SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site
SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site Sale priceMember Price: $144.00
Non-Member Price: $187.00
F11300 - SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems
SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
E06300 - SEMI E63 - Specification for 300 mm Box Opener/Loader to Tool Standard (BOLTS-M) Interface
SEMI E63 - Specification for 300 mm Box Opener/Loader to Tool Standard (BOLTS-M) Interface Sale priceMember Price: $144.00
Non-Member Price: $187.00
E05400 - SEMI E54 - Specification for Sensor/Actuator Network
SEMI E54 - Specification for Sensor/Actuator Network Sale priceMember Price: $144.00
Non-Member Price: $187.00
E00500 - SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容（SECS-II）
SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容（SECS-II） Sale priceMember Price: $334.00
Non-Member Price: $444.00
E03001 - SEMI E30.1 - Specification for Inspection and Review Specific Equipment Model (ISEM)
SEMI E30.1 - Specification for Inspection and Review Specific Equipment Model (ISEM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E01700 - SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests
SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests Sale priceMember Price: $144.00
Non-Member Price: $187.00
E14800 - SEMI E148 - Specification for Time Synchronization and Definition of the TS-Clock Object
SEMI E148 - Specification for Time Synchronization and Definition of the TS-Clock Object Sale priceMember Price: $144.00
Non-Member Price: $187.00