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MF009500 - SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer
SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers
SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF037400 - SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF163000 - SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF139200 - SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe
SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF011000 - SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique
SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07800 - SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing
SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00
M06800 - SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD
SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD Sale priceMember Price: $144.00
Non-Member Price: $187.00
M06700 - SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics
SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05000 - SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method
SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method Sale priceMember Price: $144.00
Non-Member Price: $187.00
M03500 - SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection
SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection Sale price Member Price : $144.00
HB00100 - SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
G06400 - SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd)
SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd) Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08200 - SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process
SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08700 - SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer
SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05500 - SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers
SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F06400 - SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers
SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F07600 - SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas
SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas Sale priceMember Price: $144.00
Non-Member Price: $187.00
F02800 - SEMI F28 - Test Method for Measuring Particle Generation from Process PanelsF02800 - SEMI F28 - Test Method for Measuring Particle Generation from Process Panels
SEMI F28 - Test Method for Measuring Particle Generation from Process Panels Sale priceMember Price: $144.00
Non-Member Price: $187.00
F04900 - SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity
SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity Sale priceMember Price: $144.00
Non-Member Price: $187.00
F06700 - SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity
SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity Sale priceMember Price: $144.00
Non-Member Price: $187.00