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M08900 - SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method
SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method Sale priceFrom $193.00 USD
A00500 - SEMI A5 - Specification for Factory Operation Extension for SEMI A2 SMASH (SMASH-FOX)
SEMI A5 - Specification for Factory Operation Extension for SEMI A2 SMASH (SMASH-FOX) Sale priceFrom $193.00 USD
D08000 - SEMI D80 - Test Method for Measurement of Water Vapor Transmission Rate for High Gas Barrier Plastic Film in a Short Time
SEMI D80 - Test Method for Measurement of Water Vapor Transmission Rate for High Gas Barrier Plastic Film in a Short Time Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09800 - SEMI PV98 - Specification for Silicone Adhesive for the Back Rail Fixture on Photovoltaic (PV) Modules
SEMI PV98 - Specification for Silicone Adhesive for the Back Rail Fixture on Photovoltaic (PV) Modules Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09600 - SEMI PV96 - Guide for the Design of Testing and Sorting Equipment for Crystalline Silicon Solar Cells
SEMI PV96 - Guide for the Design of Testing and Sorting Equipment for Crystalline Silicon Solar Cells Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09500 - SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance
SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09200 - SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules
SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules Sale priceMember Price: $148.00
Non-Member Price: $193.00
HB01200 - SEMI HB12 - Specification for Dry-Etched Patterned Sapphire Substrates (DPSS)
SEMI HB12 - Specification for Dry-Etched Patterned Sapphire Substrates (DPSS) Sale priceMember Price: $148.00
Non-Member Price: $193.00
HB01300 - SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface
SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV08800 - SEMI PV88 - 惰性气体熔融红外吸收法测定光伏多晶硅中氢含量的测试方法
SEMI PV88 - 惰性气体熔融红外吸收法测定光伏多晶硅中氢含量的测试方法 Sale priceMember Price: $148.00
Non-Member Price: $150.00
HB01100 - SEMI HB11 - Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers
SEMI HB11 - Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D01900 - SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling
SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling Sale priceMember Price: $148.00
Non-Member Price: $193.00
M04900 - SEMI M49 - 130 nmから65 nmへの技術世代のシリコンウェーハ用ジオメトリ測定システム規定のためのガイド
SEMI M49 - 130 nmから65 nmへの技術世代のシリコンウェーハ用ジオメトリ測定システム規定のためのガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
MS00400 - SEMI MS4 - Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance
SEMI MS4 - Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance Sale priceMember Price: $148.00
Non-Member Price: $193.00
MS00200 - SEMI MS2 - Test Method for Step Height Measurements of Thin Films
SEMI MS2 - Test Method for Step Height Measurements of Thin Films Sale priceMember Price: $148.00
Non-Member Price: $193.00
MS00100 - SEMI MS1 - Guide to Specifying Wafer-Wafer Bonding Alignment Targets
SEMI MS1 - Guide to Specifying Wafer-Wafer Bonding Alignment Targets Sale priceMember Price: $148.00
Non-Member Price: $193.00
MS01000 - SEMI MS10 - Test Method to Measure Fluid Permeation Through MEMS Packaging Materials
SEMI MS10 - Test Method to Measure Fluid Permeation Through MEMS Packaging Materials Sale priceMember Price: $148.00
Non-Member Price: $193.00
E15400 - SEMI E154 - 450 mmロードポートのためのメカニカルインタフェースの仕様
SEMI E154 - 450 mmロードポートのためのメカニカルインタフェースの仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
S00700 - SEMI S7 - 半導體製造設備的安全衛生及環保評估報告之安全基準
SEMI S7 - 半導體製造設備的安全衛生及環保評估報告之安全基準 Sale priceMember Price: $148.00
Non-Member Price: $193.00
S00600 - SEMI S6 - 半導體製造設備排氣通風基準
SEMI S6 - 半導體製造設備排氣通風基準 Sale priceMember Price: $286.00
Non-Member Price: $380.00
S00500 - SEMI S5 - 氣體鋼瓶限流裝置尺寸估量及鑑定之安全基準
SEMI S5 - 氣體鋼瓶限流裝置尺寸估量及鑑定之安全基準 Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09000 - SEMI PV90 - Guide for Material Requirements of Internal Feeders Used in Monocrystal Silicon Growers
SEMI PV90 - Guide for Material Requirements of Internal Feeders Used in Monocrystal Silicon Growers Sale priceMember Price: $148.00
Non-Member Price: $193.00
T00400 - SEMI T4 - Specification for 150 mm and 200 mm Pod Identification Dimensions
SEMI T4 - Specification for 150 mm and 200 mm Pod Identification Dimensions Sale priceMember Price: $148.00
Non-Member Price: $193.00
T02200 - SEMI T22 - Specification for Traceability by Self Authentication Service Body and Authentication Service Body
SEMI T22 - Specification for Traceability by Self Authentication Service Body and Authentication Service Body Sale priceMember Price: $148.00
Non-Member Price: $193.00
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