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E15700 - SEMI E157 - Specification for Module Process TrackingE15700 - SEMI E157 - Specification for Module Process Tracking
SEMI E157 - Specification for Module Process Tracking Sale priceMember Price: $144.00
Non-Member Price: $187.00
E13500 - SEMI E135 - Test Method for RF Generators to Determine Transient Response for RF Power Delivery Systems Used in Semiconductor Processing Equipment
SEMI E135 - Test Method for RF Generators to Determine Transient Response for RF Power Delivery Systems Used in Semiconductor Processing Equipment Sale priceMember Price: $144.00
Non-Member Price: $187.00
E12200 - SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM)
SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E11700 - SEMI E117 - Specification for Reticle Load Port
SEMI E117 - Specification for Reticle Load Port Sale priceMember Price: $144.00
Non-Member Price: $187.00
E10900 - SEMI E109 - Specification for Reticle and Pod Management (RPMS)
SEMI E109 - Specification for Reticle and Pod Management (RPMS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
D06100 - SEMI D61 - Test Method of Perceptual Angle for OLED Displays
SEMI D61 - Test Method of Perceptual Angle for OLED Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
D04100 - SEMI D41 - Measurement Method of SEMI MURA in FPD Image Quality Inspection
SEMI D41 - Measurement Method of SEMI MURA in FPD Image Quality Inspection Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08900 - SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS)
SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08300 - SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting
SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting Sale priceMember Price: $144.00
Non-Member Price: $187.00
C07700 - SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm
SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm Sale priceMember Price: $144.00
Non-Member Price: $187.00
C05600 - SEMI C56 - Specification for Dichlorosilane (SiH2Cl2)
SEMI C56 - Specification for Dichlorosilane (SiH2Cl2) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C03600 - SEMI C36 - Specification for Phosphoric Acid
SEMI C36 - Specification for Phosphoric Acid Sale priceMember Price: $144.00
Non-Member Price: $187.00
C02700 - SEMI C27 - Specification and Guide for Hydrochloric Acid
SEMI C27 - Specification and Guide for Hydrochloric Acid Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D00700 - SEMI 3D7 - Guide for Alignment Mark for 3DS-IC Process
SEMI 3D7 - Guide for Alignment Mark for 3DS-IC Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
F12000 - SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems
SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
F00200 - SEMI F2 - Specification for 316L Stainless Steel Tubing for General Purpose Semiconductor Manufacturing Applications
SEMI F2 - Specification for 316L Stainless Steel Tubing for General Purpose Semiconductor Manufacturing Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17900 - SEMI E179 - Specification for Protocol Buffers Common Components
SEMI E179 - Specification for Protocol Buffers Common Components Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS01200 - SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices
SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
G09100 - SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog
SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog Sale priceMember Price: $144.00
Non-Member Price: $187.00
P02400 - SEMI P24 - CD Metrology Procedures
SEMI P24 - CD Metrology Procedures Sale priceMember Price: $144.00
Non-Member Price: $187.00
P00200 - SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks
SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks Sale priceMember Price: $144.00
Non-Member Price: $187.00
F04000 - SEMI F40 - 化学試験のための薬液分配部品の準備についての作業方法
SEMI F40 - 化学試験のための薬液分配部品の準備についての作業方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
MF065700 - SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning
SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01300 - SEMI M13 - シリコンウェーハの英数字マーキングの仕様
SEMI M13 - シリコンウェーハの英数字マーキングの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00