Standard All – Page 15

1631 products

F00900 - SEMI F9 - Test Method to Determine the Leakage Characteristics of Tube Fitting Connections Made of Fluorocarbon Materials, When Subjected to a Side Load Condition

SEMI F9 - Test Method to Determine the Leakage Characteristics of Tube Fitting Connections Made of Fluorocarbon Materials, When Subjected to a Side Load Condition

$300.00 USD

$187.00 USD

F08800 - SEMI F88 - Specification for Dimension of Standard Size Mass Flow Controllers and Mass Flow Meters for 1.5 Inch Type Surface Mount Gas Distribution Systems

SEMI F88 - Specification for Dimension of Standard Size Mass Flow Controllers and Mass Flow Meters for 1.5 Inch Type Surface Mount Gas Distribution Systems

Member Price: $144.00
Non-Member Price: $187.00

F01200 - SEMI F12 - Test Method to Determine the Sealing Capabilities of Fittings, Made of Fluorocarbon Material, after Being Subjected to a Heat Cycle

SEMI F12 - Test Method to Determine the Sealing Capabilities of Fittings, Made of Fluorocarbon Material, after Being Subjected to a Heat Cycle

$300.00 USD

$187.00 USD

F102000 - SEMI F102 - Guide for Selecting Specifications for Dimension of Components for Surface Mount Gas Distribution Systems

SEMI F102 - Guide for Selecting Specifications for Dimension of Components for Surface Mount Gas Distribution Systems

Member Price: $144.00
Non-Member Price: $187.00

E09800 - SEMI E98 - Provisional Standard for the Object-Based Equipment Model (OBEM)

SEMI E98 - Provisional Standard for the Object-Based Equipment Model (OBEM)

Member Price: $144.00
Non-Member Price: $187.00

E07300 - SEMI E73 - Specification for Vacuum Pump Interfaces - Dry Pumps

SEMI E73 - Specification for Vacuum Pump Interfaces - Dry Pumps

Member Price: $144.00
Non-Member Price: $187.00

E16100 - SEMI E161 - Guide for Identification and Classification of Training Tiers

SEMI E161 - Guide for Identification and Classification of Training Tiers

Member Price: $144.00
Non-Member Price: $187.00

E11000 - SEMI E110 - Guideline for Indicator Placement Zone and Switch Placement Volume of Load Port Operation Interface for 300 mm Load Ports

SEMI E110 - Guideline for Indicator Placement Zone and Switch Placement Volume of Load Port Operation Interface for 300 mm Load Ports

Member Price: $144.00
Non-Member Price: $187.00

T00900 - SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol

SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol

Member Price: $144.00
Non-Member Price: $187.00

PV00900 - SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse

SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse

Member Price: $144.00
Non-Member Price: $187.00

PV05700 - SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

Member Price : $144.00

PV0036 - SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications

SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications

Member Price: $144.00
Non-Member Price: $187.00

PV00200 - SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)

SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)

Member Price: $144.00
Non-Member Price: $187.00

P00900 - SEMI P9 - Guide for Functional Testing of Microelectronic Resists

SEMI P9 - Guide for Functional Testing of Microelectronic Resists

Member Price: $144.00
Non-Member Price: $187.00

P04800 - SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank

SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank

Member Price: $144.00
Non-Member Price: $187.00

MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers

SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers

Member Price: $144.00
Non-Member Price: $187.00

MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry

SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry

Member Price: $144.00
Non-Member Price: $187.00

SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data

Member Price: $144.00
Non-Member Price: $187.00

MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers

SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers

Member Price: $144.00
Non-Member Price: $187.00

M00800 - SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers

SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers

Member Price: $144.00
Non-Member Price: $187.00

M07800 - SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing

SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing

Member Price: $144.00
Non-Member Price: $187.00

M07100 - SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI

SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI

Member Price: $144.00
Non-Member Price: $187.00

M06800 - SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD

SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD

Member Price: $144.00
Non-Member Price: $187.00

M06700 - SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics

SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics

Member Price: $144.00
Non-Member Price: $187.00