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E19400 - SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons
MS01500 - SEMI MS15 - Guide to MEMS Manufacturing Readiness Levels
SEMI MS15 - Guide to MEMS Manufacturing Readiness Levels Sale priceMember Price: $148.00
Non-Member Price: $193.00
T02500 - SEMI T25 - Specification for Blockchain for Semiconductor Supply Chain Traceability
C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA)
SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) Sale priceMember Price: $148.00
Non-Member Price: $193.00
F12000 - SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems
3D02200 - SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications
C10200 - SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing
PV09400 - SEMI PV94 - Guide for Identifying Cell Defects In Crystalline Silicon Photovoltaic (PV) Modules By Electroluminescence (EL) Imaging
MS01200 - SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices
SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV09100 - SEMI PV91 - Specification for Trichlorosilane Used in Polysilicon Production
SEMI PV91 - Specification for Trichlorosilane Used in Polysilicon Production Sale priceMember Price: $148.00
Non-Member Price: $193.00
E17700 - SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows
G09100 - SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog
SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00300 - SEMI C3 - ガスの仕様
SEMI C3 - ガスの仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
C00100 - SEMI C1 - 液体化学薬品の分析のためのガイド
SEMI C1 - 液体化学薬品の分析のためのガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
P02400 - SEMI P24 - CD Metrology Procedures
SEMI P24 - CD Metrology Procedures Sale priceMember Price: $148.00
Non-Member Price: $193.00
F02000 - SEMI F20 - 高純度および超高純度の半導体製造アプリケーションで使用される汎用コンポーネント用の316Lステンレス鋼の棒鋼,鍛造品,押出成形品,鋼板,鋼管の仕様
M07300 - SEMI M73 - 測定したウェーハエッジプロファイルから直接的関連性ある特性を抽出するテスト方法
M01300 - SEMI M13 - シリコンウェーハの英数字マーキングの仕様
SEMI M13 - シリコンウェーハの英数字マーキングの仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
MS00500 - SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures
E07200 - SEMI E72 - 300 mm装置の床面積,高さ,重量の仕様ならびにガイド
SEMI E72 - 300 mm装置の床面積,高さ,重量の仕様ならびにガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
E04000 - SEMI E40 - プロセス管理スタンダード
SEMI E40 - プロセス管理スタンダード Sale priceMember Price: $176.00
Non-Member Price: $231.00
E00400 - SEMI E4 - 半導体製造装置通信スタンダード1 メッセージトランスファ(SECS-I)
S00900 - SEMI S9 - Guide to Electrical Design Verification Tests for Semiconductor Manufacturing Equipment that have Been Moved to SEMI S22
PV08900 - SEMI PV89 - Test Method of Current-Voltage (I-V) Measurement in Indoor Lighting for Dye-Sensitized Solar Cell and Organic Photovoltaic and Perovskite Solar Cell (PSC)