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1638 products

E03900 - SEMI E39 - 객체 서비스 표준: 컨셉트, 동작, 서비스
SEMI E39 - 객체 서비스 표준: 컨셉트, 동작, 서비스 Sale priceMember Price: $148.00
Non-Member Price: $193.00
E12000 - SEMI E120 - 共通装置モデル（CEM）の仕様
SEMI E120 - 共通装置モデル（CEM）の仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
S00800 - SEMI S8 - 半導體製造設備人因工程之安全基準
SEMI S8 - 半導體製造設備人因工程之安全基準 Sale priceMember Price: $286.00
Non-Member Price: $380.00
S02200 - SEMI S22 - 半導體製造設備電氣設計安全基準
SEMI S22 - 半導體製造設備電氣設計安全基準 Sale price Member Price : $148.00
F09600 - SEMI F96 - Specification for Port Configuration of Canisters to Contain CVD Precursors
SEMI F96 - Specification for Port Configuration of Canisters to Contain CVD Precursors Regular price$300.00 USD Sale price$193.00 USD
F01000 - SEMI F10 - Test Method to Determine the Internal Pressure Required to Produce a Failure of a Tube Fitting Connection Made of Fluorocarbon Materials
SEMI F10 - Test Method to Determine the Internal Pressure Required to Produce a Failure of a Tube Fitting Connection Made of Fluorocarbon Materials Regular price$300.00 USD Sale price$193.00 USD
E16100 - SEMI E161 - Guide for Identification and Classification of Training Tiers
SEMI E161 - Guide for Identification and Classification of Training Tiers Sale priceMember Price: $148.00
Non-Member Price: $193.00
E14700 - SEMI E147 - Guide for Equipment Data Acquisition (EDA)
SEMI E147 - Guide for Equipment Data Acquisition (EDA) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E12700 - SEMI E127 - Specification for Integrated Measurement Module Communications: Concepts, Behavior, and Services (IMMC)
SEMI E127 - Specification for Integrated Measurement Module Communications: Concepts, Behavior, and Services (IMMC) Sale priceMember Price: $148.00
Non-Member Price: $193.00
S02500 - SEMI S25 - Safety Guideline for Hydrogen Peroxide Storage & Handling Systems
SEMI S25 - Safety Guideline for Hydrogen Peroxide Storage & Handling Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV04900 - SEMI PV49 - Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells by Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry
SEMI PV49 - Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells by Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF072300 - SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon
SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers
SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers
SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF139100 - SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption
SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption Sale priceMember Price: $148.00
Non-Member Price: $193.00
M00800 - SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers
SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
M07800 - SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing
SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing Sale priceMember Price: $148.00
Non-Member Price: $193.00
M07700 - SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA
SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA Sale priceMember Price: $148.00
Non-Member Price: $193.00
M07100 - SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI
SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI Sale priceMember Price: $148.00
Non-Member Price: $193.00
M06800 - SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD
SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD Sale priceMember Price: $148.00
Non-Member Price: $193.00
M06700 - SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics
SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics Sale priceMember Price: $148.00
Non-Member Price: $193.00
M06200 - SEMI M62 - Specification for Silicon Epitaxial Wafers
SEMI M62 - Specification for Silicon Epitaxial Wafers Sale price Member Price : $148.00
M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces Sale priceMember Price: $148.00
Non-Member Price: $193.00