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C08300 - SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting
C07700 - SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm
C05600 - SEMI C56 - Specification for Dichlorosilane (SiH2Cl2)
SEMI C56 - Specification for Dichlorosilane (SiH2Cl2) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C02700 - SEMI C27 - Specification and Guide for Hydrochloric Acid
SEMI C27 - Specification and Guide for Hydrochloric Acid Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D00700 - SEMI 3D7 - Guide for Alignment Mark for 3DS-IC Process
SEMI 3D7 - Guide for Alignment Mark for 3DS-IC Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
F12000 - SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems
3D02200 - SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications
MS01200 - SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices
SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17700 - SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows
G09100 - SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog
SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog Sale priceMember Price: $144.00
Non-Member Price: $187.00
P02400 - SEMI P24 - CD Metrology Procedures
SEMI P24 - CD Metrology Procedures Sale priceMember Price: $144.00
Non-Member Price: $187.00
P00200 - SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks
SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF065700 - SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning
M01300 - SEMI M13 - シリコンウェーハの英数字マーキングの仕様
SEMI M13 - シリコンウェーハの英数字マーキングの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
MS00500 - SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures
E07200 - SEMI E72 - 300 mm装置の床面積,高さ,重量の仕様ならびにガイド
SEMI E72 - 300 mm装置の床面積,高さ,重量の仕様ならびにガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
E00400 - SEMI E4 - 半導体製造装置通信スタンダード1 メッセージトランスファ(SECS-I)
E14200 - SEMI E142 - 基板マッピングの仕様
SEMI E142 - 基板マッピングの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
S00900 - SEMI S9 - Guide to Electrical Design Verification Tests for Semiconductor Manufacturing Equipment that have Been Moved to SEMI S22
S02300 - SEMI S23 - 半導体製造装置で使用されるエネルギー,ユーティリティ,および材料の保全のためのガイド
S02200 - SEMI S22 - 半導體製造設備電氣設計安全基準
PV08900 - SEMI PV89 - Test Method of Current-Voltage (I-V) Measurement in Indoor Lighting for Dye-Sensitized Solar Cell and Organic Photovoltaic and Perovskite Solar Cell (PSC)
F09600 - SEMI F96 - Specification for Port Configuration of Canisters to Contain CVD Precursors
F09500 - SEMI F95 - Specification for Dimension of Three Port Components for 1.5 Inch Four Fastener Configuration Type Surface Mount Gas Distribution Systems