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F00900 - SEMI F9 - Test Method to Determine the Leakage Characteristics of Tube Fitting Connections Made of Fluorocarbon Materials, When Subjected to a Side Load Condition
SEMI F9 - Test Method to Determine the Leakage Characteristics of Tube Fitting Connections Made of Fluorocarbon Materials, When Subjected to a Side Load Condition Regular price$300.00 USD Sale price$193.00 USD
F08800 - SEMI F88 - Specification for Dimension of Standard Size Mass Flow Controllers and Mass Flow Meters for 1.5 Inch Type Surface Mount Gas Distribution Systems
SEMI F88 - Specification for Dimension of Standard Size Mass Flow Controllers and Mass Flow Meters for 1.5 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
F02700 - SEMI F27 - Test Method for Moisture Interaction and Content of Gas Distribution Systems and Components by Atmospheric Pressure Ionization Mass Spectrometry (APIMS)
SEMI F27 - Test Method for Moisture Interaction and Content of Gas Distribution Systems and Components by Atmospheric Pressure Ionization Mass Spectrometry (APIMS) Sale priceMember Price: $148.00
Non-Member Price: $193.00
F01200 - SEMI F12 - Test Method to Determine the Sealing Capabilities of Fittings, Made of Fluorocarbon Material, after Being Subjected to a Heat Cycle
SEMI F12 - Test Method to Determine the Sealing Capabilities of Fittings, Made of Fluorocarbon Material, after Being Subjected to a Heat Cycle Regular price$300.00 USD Sale price$193.00 USD
F102000 - SEMI F102 - Guide for Selecting Specifications for Dimension of Components for Surface Mount Gas Distribution Systems
SEMI F102 - Guide for Selecting Specifications for Dimension of Components for Surface Mount Gas Distribution Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
E09800 - SEMI E98 - Provisional Standard for the Object-Based Equipment Model (OBEM)
SEMI E98 - Provisional Standard for the Object-Based Equipment Model (OBEM) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E07300 - SEMI E73 - Specification for Vacuum Pump Interfaces - Dry Pumps
SEMI E73 - Specification for Vacuum Pump Interfaces - Dry Pumps Sale priceMember Price: $148.00
Non-Member Price: $193.00
E06400 - SEMI E64 - Specification for 300 mm Cart to SEMI E15.1 Docking Interface Port
SEMI E64 - Specification for 300 mm Cart to SEMI E15.1 Docking Interface Port Sale priceMember Price: $148.00
Non-Member Price: $193.00
E04600 - SEMI E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS)
SEMI E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E11000 - SEMI E110 - Guideline for Indicator Placement Zone and Switch Placement Volume of Load Port Operation Interface for 300 mm Load Ports
SEMI E110 - Guideline for Indicator Placement Zone and Switch Placement Volume of Load Port Operation Interface for 300 mm Load Ports Sale priceMember Price: $148.00
Non-Member Price: $193.00
E10000 - SEMI E100 - Specification for a Reticle SMIF Pod (RSP) Used to Transport and Store 6 Inch or 230 mm Reticles
SEMI E100 - Specification for a Reticle SMIF Pod (RSP) Used to Transport and Store 6 Inch or 230 mm Reticles Sale priceMember Price: $148.00
Non-Member Price: $193.00
T00900 - SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol
SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol Sale priceMember Price: $148.00
Non-Member Price: $193.00
S01700 - SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン
SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン Sale priceMember Price: $176.00
Non-Member Price: $231.00
PV00900 - SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse
SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV05700 - SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)
SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC) Sale price Member Price : $148.00
PV0036 - SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications
SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV00200 - SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)
SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI) Sale priceMember Price: $148.00
Non-Member Price: $193.00
P00900 - SEMI P9 - Guide for Functional Testing of Microelectronic Resists
SEMI P9 - Guide for Functional Testing of Microelectronic Resists Sale priceMember Price: $148.00
Non-Member Price: $193.00
P04800 - SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank
SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF009500 - SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer
SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials
SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $148.00
Non-Member Price: $193.00