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E03200 - SEMI E32 - Material Movement Management (MMM)
SEMI E32 - Material Movement Management (MMM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
T00900 - SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol
SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01700 - SEMI S17 - 無人搬運車（UTV）系統之安全基準
SEMI S17 - 無人搬運車（UTV）系統之安全基準 Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01700 - SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン
SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン Sale priceMember Price: $171.00
Non-Member Price: $224.00
PV07600 - SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)
SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC) Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV07500 - SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials
SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV05400 - SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells
SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV05100 - SEMI PV51 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence
SEMI PV51 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF009500 - SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer
SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers
SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF037400 - SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF163000 - SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF139200 - SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe
SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF011000 - SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique
SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07800 - SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing
SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00
M06800 - SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD
SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD Sale priceMember Price: $144.00
Non-Member Price: $187.00
M06700 - SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics
SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05900 - SEMI M59 - Terminology for Silicon Technology
SEMI M59 - Terminology for Silicon Technology Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05000 - SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method
SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method Sale priceMember Price: $144.00
Non-Member Price: $187.00
M03500 - SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection
SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection Sale price Member Price : $144.00
HB00100 - SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00