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SEMI P34 - Specification for 230 mm Square Photomask Substrates
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI P32 - Test Method for Determination of Trace Metals in Photoresist
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI P28 - Specification for Overlay-Metrology Test Patterns for Integrated-Circuit Manufacture
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI P26 - Parameter Checklist for Photoresist Sensitivity Measurement
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI P21 - Guidelines for Precision and Accuracy Expression for Mask Writing Equipment
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI P19 - Specification for Metrology Pattern Cells for Integrated Circuit Manufacture
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI P18 - Specification for Overlay Capabilities of Wafer Steppers
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI G84 - Specification for Strip Map Protocol
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI F71 - ガス供給システムの温度サイクル試験方法
Regular price$300.00 USD
Sale price$224.00 USD
SEMI F77 - 腐食性のガスシステムに使用される合金表面の電気化学的臨界孔食温度のテスト方法
Sale priceMember Price: $171.00
Non-Member Price: $224.00
Non-Member Price: $224.00
SEMI F37 - ガス供給システム構成部品の表面粗さパラメータの算出方法
Sale priceMember Price: $171.00
Non-Member Price: $224.00
Non-Member Price: $224.00
SEMI F29 - ガスソースシステムパネルのパージ効果のテスト方法
Sale priceMember Price: $171.00
Non-Member Price: $224.00
Non-Member Price: $224.00
SEMI F20 - 高純度および超高純度の半導体製造アプリケーションで使用される汎用コンポーネント用の316Lステンレス鋼の棒鋼，鍛造品，押出成形品，鋼板，鋼管の仕様
Sale priceMember Price: $171.00
Non-Member Price: $224.00
Non-Member Price: $224.00
SEMI M52 - 130 nm，90nm，65nmおよび45nm技術世代シリコンウェーハ用走査型表面検査装置仕様のためのガイド
Sale priceMember Price: $171.00
Non-Member Price: $224.00
Non-Member Price: $224.00
SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI M32 - Guide to Statistical Specifications
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI M3 - Specifications for Polished Monocrystalline Sapphire Substrates
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI M20 - ウェーハ座標システムの確立の作業方法
Sale priceMember Price: $171.00
Non-Member Price: $224.00
Non-Member Price: $224.00
SEMI M18 - Format for Silicon Wafer Specification Form for Order Entry
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI M15 - Polished Wafer Defect Limits Table for Semi-Insulating Gallium Arsenide Wafers
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages
Regular price$300.00 USD
Sale price$187.00 USD
SEMI MS3 - Terminology for MEMS Technology
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI MS11 - Specification for Microfluidic Port and Pitch Dimensions
Sale priceMember Price: $144.00
Non-Member Price: $187.00
Non-Member Price: $187.00
SEMI E99 - キャリアIDリーダ／ライタ機能スタンダード：コンセプト，挙動，およびサービスに関する仕様
Sale priceMember Price: $171.00
Non-Member Price: $224.00
Non-Member Price: $224.00