Standard All

testing

Filters

Sort by:

1638 products

MF139200 - SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe
SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline
SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF011000 - SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique
SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique Sale priceMember Price: $148.00
Non-Member Price: $193.00
M05000 - SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method
SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method Sale priceMember Price: $148.00
Non-Member Price: $193.00
M03500 - SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection
SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection Sale price Member Price : $148.00
HB00100 - SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices Sale priceMember Price: $148.00
Non-Member Price: $193.00
HB01000 - SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers
SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
G06400 - SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd)
SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd) Sale priceMember Price: $148.00
Non-Member Price: $193.00
G08200 - SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process
SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process Sale priceMember Price: $148.00
Non-Member Price: $193.00
G01100 - SEMI G11 - Practice for RAM Follower Gel Time and Spiral Flow of Thermal Setting Molding Compounds
SEMI G11 - Practice for RAM Follower Gel Time and Spiral Flow of Thermal Setting Molding Compounds Sale priceMember Price: $148.00
Non-Member Price: $193.00
F05500 - SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers
SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers Sale priceMember Price: $148.00
Non-Member Price: $193.00
F04400 - SEMI F44 - Specification for Machined Stainless Steel Weld Fittings
SEMI F44 - Specification for Machined Stainless Steel Weld Fittings Sale price Member Price : $175.00
F07600 - SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas
SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas Sale priceMember Price: $148.00
Non-Member Price: $193.00
F06900 - SEMI F69 - Test Method for Transport and Shock Testing of Gas Delivery Systems
SEMI F69 - Test Method for Transport and Shock Testing of Gas Delivery Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
F04300 - SEMI F43 - ユースポイントガス精製器およびガスフィルタによるパーティクルに対する寄与度を定量化するための試験方法
SEMI F43 - ユースポイントガス精製器およびガスフィルタによるパーティクルに対する寄与度を定量化するための試験方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
F07300 - SEMI F73 - ステンレス鋼部品の接ガス表面状態の走査型電子顕微鏡（SEM）による評価テスト方法
SEMI F73 - ステンレス鋼部品の接ガス表面状態の走査型電子顕微鏡（SEM）による評価テスト方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
F01900 - SEMI F19 - ステンレススチール部品の接ガス・接液面の表面仕上げのための仕様
SEMI F19 - ステンレススチール部品の接ガス・接液面の表面仕上げのための仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
F03800 - SEMI F38 - ユースポイントガスフィルタの効率資格付けを目的とした試験方法
SEMI F38 - ユースポイントガスフィルタの効率資格付けを目的とした試験方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
E05420 - SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT®
SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT® Sale priceMember Price: $148.00
Non-Member Price: $193.00
E04300 - SEMI E43 - 物体および表面上の静電気測定のためのガイド
SEMI E43 - 物体および表面上の静電気測定のためのガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
E02800 - SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller
SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller Sale priceMember Price: $148.00
Non-Member Price: $193.00
E02100 - SEMI E21 - Specification for Cluster Tool Module Interface: Mechanical Interface and Wafer Transport
SEMI E21 - Specification for Cluster Tool Module Interface: Mechanical Interface and Wafer Transport Sale priceMember Price: $148.00
Non-Member Price: $193.00
E17100 - SEMI E171 - Specification for Predictive Carrier Logistics (PCL)
SEMI E171 - Specification for Predictive Carrier Logistics (PCL) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E17000 - SEMI E170 - Specification for Secured Foundation Of Recipe Management System (SFORMS)
SEMI E170 - Specification for Secured Foundation Of Recipe Management System (SFORMS) Sale priceMember Price: $148.00
Non-Member Price: $193.00