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C00335 - SEMI C3.35 - Specification for Hydrogen Chloride (HCI), 99.997% Quality
SEMI C3.35 - Specification for Hydrogen Chloride (HCI), 99.997% Quality Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00312 - SEMI C3.12 - Specification for Ammonia (NH3) in Cylinders, 99.998% Quality
SEMI C3.12 - Specification for Ammonia (NH3) in Cylinders, 99.998% Quality Sale priceMember Price: $148.00
Non-Member Price: $193.00
C02400 - SEMI C24 - Specification for n-Butyl Acetate
SEMI C24 - Specification for n-Butyl Acetate Sale priceMember Price: $148.00
Non-Member Price: $193.00
C01500 - SEMI C15 - Test Method for ppm and ppb Humidity Standards
SEMI C15 - Test Method for ppm and ppb Humidity Standards Sale priceMember Price: $148.00
Non-Member Price: $193.00
C01400 - SEMI C14 - Test Method for Particle Shedding Performance of 25 cm Gas Filter Cartridges
SEMI C14 - Test Method for Particle Shedding Performance of 25 cm Gas Filter Cartridges Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D01800 - SEMI 3D18 - Guide for Wafer Edge Trimming for 3DS-IC Process
SEMI 3D18 - Guide for Wafer Edge Trimming for 3DS-IC Process Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D01100 - SEMI 3D11 - Terminology for Through Glass Via and Blind Via in Glass Geometrical Metrology
SEMI 3D11 - Terminology for Through Glass Via and Blind Via in Glass Geometrical Metrology Sale priceMember Price: $148.00
Non-Member Price: $193.00
E19700 - SEMI E197 - Specification for Large Tray Stack FOUP (LTSF)
SEMI E197 - Specification for Large Tray Stack FOUP (LTSF) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E19600 - SEMI E196 - Guide for Equipment Edge Data Governance
SEMI E196 - Guide for Equipment Edge Data Governance Sale priceMember Price: $148.00
Non-Member Price: $193.00
E19000 - SEMI E190 - Specification for Equipment Data Publication (EDP)
SEMI E190 - Specification for Equipment Data Publication (EDP) Sale priceMember Price: $148.00
Non-Member Price: $193.00
FH00400 - SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products
SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products Sale priceFrom $193.00 USD
D08600 - SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays
SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV10100 - SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building
SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building Sale priceMember Price: $148.00
Non-Member Price: $193.00
FH00200 - SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles
SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles Sale priceMember Price: $148.00
Non-Member Price: $193.00
FH00100 - SEMI FH1 - Test Method of Line Impedance for Electronic Textiles
SEMI FH1 - Test Method of Line Impedance for Electronic Textiles Sale priceMember Price: $148.00
Non-Member Price: $193.00
G10200 - SEMI G102 - Specification for Shear Strength of Encapsulation Materials for Wafer Level Packaging and Panel Level Packaging
SEMI G102 - Specification for Shear Strength of Encapsulation Materials for Wafer Level Packaging and Panel Level Packaging Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV07300 - SEMI PV73 - Test Method for Thin-Film Silicon Photovoltaic (PV) Modules Light Soaking
SEMI PV73 - Test Method for Thin-Film Silicon Photovoltaic (PV) Modules Light Soaking Sale priceMember Price: $148.00
Non-Member Price: $193.00
C10400 - SEMI C104 - Guide for Reporting Performance Parameters of the Polymer Windows for Chemical Mechanical Planarization (CMP) Pads Used in Semiconductor Manufacturing
SEMI C104 - Guide for Reporting Performance Parameters of the Polymer Windows for Chemical Mechanical Planarization (CMP) Pads Used in Semiconductor Manufacturing Sale priceMember Price: $148.00
Non-Member Price: $193.00
E18000 - SEMI E180 - 通过ICP-MS测量半导体晶圆加工过程中关键腔室部件表面金属污染的试验方法
SEMI E180 - 通过ICP-MS测量半导体晶圆加工过程中关键腔室部件表面金属污染的试验方法 Sale priceMember Price: $148.00
Non-Member Price: $193.00
F11800 - SEMI F118 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components
SEMI F118 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components Sale priceMember Price: $148.00
Non-Member Price: $193.00
F11700 - SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems
SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
C10300 - SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing
SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing Sale priceMember Price: $148.00
Non-Member Price: $193.00
C10100 - SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: $148.00
Non-Member Price: $193.00
D07900 - SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays
SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays Sale priceMember Price: $148.00
Non-Member Price: $193.00