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1894 products

MF115300 - SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements
SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated ScatterMF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter
SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter Sale priceMember Price: $144.00
Non-Member Price: $187.00
M08600 - SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers
SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07800 - SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing
SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00
M06800 - SEMI M68 - 測定した高さデータ配列から曲率法ZDDを使ってウェーハのエッジ近傍形状を決定するための作業方法
SEMI M68 - 測定した高さデータ配列から曲率法ZDDを使ってウェーハのエッジ近傍形状を決定するための作業方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M06700 - SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics
SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05900 - SEMI M59 - Terminology for Silicon Technology
SEMI M59 - Terminology for Silicon Technology Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05400 - SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters
SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05000 - SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method
SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04600 - SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling
SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04100 - SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs
SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs Sale priceMember Price: $144.00
Non-Member Price: $187.00
M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers
SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G06700 - SEMI G67 - Test Method for the Measurement of Particle Generation from Sheet Materials
SEMI G67 - Test Method for the Measurement of Particle Generation from Sheet Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
G06600 - SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds
SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08200 - SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process
SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
G05700 - SEMI G57 - Guide for Standardization of Leadframe Terminology
SEMI G57 - Guide for Standardization of Leadframe Terminology Sale priceMember Price: $144.00
Non-Member Price: $187.00
G01000 - SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes
SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07000 - SEMI G70 - Standard for Equipment and Leadframe Fixtures for Measurement of Plastic Package Leadframes
SEMI G70 - Standard for Equipment and Leadframe Fixtures for Measurement of Plastic Package Leadframes Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05500 - SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers
SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05400 - SEMI F54 - Test Method for Measuring the Counting Efficiency of Condensation Nucleus Counters
SEMI F54 - Test Method for Measuring the Counting Efficiency of Condensation Nucleus Counters Sale priceMember Price: $144.00
Non-Member Price: $187.00
F07600 - SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas
SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas Sale priceMember Price: $144.00
Non-Member Price: $187.00
F02400 - SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases
SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases Sale priceMember Price: $144.00
Non-Member Price: $187.00
F03000 - SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site
SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site Sale priceMember Price: $144.00
Non-Member Price: $187.00