Best Selling Products – Page 22

1852 products

E09800 - SEMI E98 - Provisional Standard for the Object-Based Equipment Model (OBEM)

SEMI E98 - Provisional Standard for the Object-Based Equipment Model (OBEM)

Member Price: $148.00
Non-Member Price: $193.00

E07300 - SEMI E73 - Specification for Vacuum Pump Interfaces - Dry Pumps

SEMI E73 - Specification for Vacuum Pump Interfaces - Dry Pumps

Member Price: $148.00
Non-Member Price: $193.00

E06400 - SEMI E64 - Specification for 300 mm Cart to SEMI E15.1 Docking Interface Port

SEMI E64 - Specification for 300 mm Cart to SEMI E15.1 Docking Interface Port

Member Price: $148.00
Non-Member Price: $193.00

E04600 - SEMI E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS)

SEMI E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS)

Member Price: $148.00
Non-Member Price: $193.00

E11000 - SEMI E110 - Guideline for Indicator Placement Zone and Switch Placement Volume of Load Port Operation Interface for 300 mm Load Ports

SEMI E110 - Guideline for Indicator Placement Zone and Switch Placement Volume of Load Port Operation Interface for 300 mm Load Ports

Member Price: $148.00
Non-Member Price: $193.00

E10000 - SEMI E100 - Specification for a Reticle SMIF Pod (RSP) Used to Transport and Store 6 Inch or 230 mm Reticles

SEMI E100 - Specification for a Reticle SMIF Pod (RSP) Used to Transport and Store 6 Inch or 230 mm Reticles

Member Price: $148.00
Non-Member Price: $193.00

T00900 - SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol

SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol

Member Price: $148.00
Non-Member Price: $193.00

S01700 - SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン

SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン

Member Price: $176.00
Non-Member Price: $231.00

PV00900 - SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse

SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse

Member Price: $148.00
Non-Member Price: $193.00

PV05700 - SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

Member Price : $148.00

PV0036 - SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications

SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications

Member Price: $148.00
Non-Member Price: $193.00

PV00200 - SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)

SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)

Member Price: $148.00
Non-Member Price: $193.00

P00900 - SEMI P9 - Guide for Functional Testing of Microelectronic Resists

SEMI P9 - Guide for Functional Testing of Microelectronic Resists

Member Price: $148.00
Non-Member Price: $193.00

P04800 - SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank

SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank

Member Price: $148.00
Non-Member Price: $193.00

MF009500 - SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer

SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer

Member Price: $148.00
Non-Member Price: $193.00

MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

Member Price: $148.00
Non-Member Price: $193.00

MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry

SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry

Member Price: $148.00
Non-Member Price: $193.00

SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data

Member Price: $148.00
Non-Member Price: $193.00

MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities

SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities

Member Price: $148.00
Non-Member Price: $193.00

M05900 - SEMI M59 - Terminology for Silicon Technology

SEMI M59 - Terminology for Silicon Technology

Member Price: $148.00
Non-Member Price: $193.00

M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers

SEMI M38 - Specification for Polished Reclaimed Silicon Wafers

Member Price: $148.00
Non-Member Price: $193.00

M01000 - SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers

SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers

Member Price: $148.00
Non-Member Price: $193.00

F06400 - SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers

SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers

Member Price: $148.00
Non-Member Price: $193.00

F03000 - SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site

SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site

Member Price: $148.00
Non-Member Price: $193.00