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F11300 - SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems
SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
F02800 - SEMI F28 - Test Method for Measuring Particle Generation from Process PanelsF02800 - SEMI F28 - Test Method for Measuring Particle Generation from Process Panels
SEMI F28 - Test Method for Measuring Particle Generation from Process Panels Sale priceMember Price: $148.00
Non-Member Price: $193.00
F06700 - SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity
SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity Sale priceMember Price: $148.00
Non-Member Price: $193.00
F05300 - SEMI F53 - Test Method for Evaluating the Electromagnetic Susceptibility of Thermal Mass Flow Controllers
E05400 - SEMI E54 - Specification for Sensor/Actuator Network
SEMI E54 - Specification for Sensor/Actuator Network Sale priceMember Price: $148.00
Non-Member Price: $193.00
E03001 - SEMI E30.1 - Specification for Inspection and Review Specific Equipment Model (ISEM)
SEMI E30.1 - Specification for Inspection and Review Specific Equipment Model (ISEM) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E17300 - SEMI E173 - Specification for XML SECS-II Message Notation (SMN)
SEMI E173 - Specification for XML SECS-II Message Notation (SMN) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling
E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port
SEMI E154 - Specification for Mechanical Features of 450 mm Load Port Regular price$300.00 USD Sale price$193.00 USD
E11300 - SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems
D07500 - SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display
SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display Sale priceMember Price: $148.00
Non-Member Price: $193.00
D00600 - SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates
SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00305 - SEMI C3.5 - Standard for Nitrogen (N2), Bulk Liquid, 99.998% Quality
SEMI C3.5 - Standard for Nitrogen (N2), Bulk Liquid, 99.998% Quality Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00349 - SEMI C3.49 - Standard for Bulk Nitrogen (N2), 99.99999% Quality
SEMI C3.49 - Standard for Bulk Nitrogen (N2), 99.99999% Quality Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00343 - SEMI C3.43 - Standard for Hydrogen Fluoride (HF), Anhydrous (Provisional)
SEMI C3.43 - Standard for Hydrogen Fluoride (HF), Anhydrous (Provisional) Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00329 - SEMI C3.29 - Standard for Nitrogen (N2), Bulk Gaseous, 99.9995% Quality
SEMI C3.29 - Standard for Nitrogen (N2), Bulk Gaseous, 99.9995% Quality Sale priceMember Price: $148.00
Non-Member Price: $193.00
C04600 - SEMI C46 - Guide for 25% Tetramethylammonium Hydroxide
SEMI C46 - Guide for 25% Tetramethylammonium Hydroxide Sale priceMember Price: $148.00
Non-Member Price: $193.00
C09100 - SEMI C91 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components
C00334 - SEMI C3.34 - Specification for Disilane (Si2H6) in Cylinders, 97% Quality
SEMI C3.34 - Specification for Disilane (Si2H6) in Cylinders, 97% Quality Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00320 - SEMI C3.20 - Specification for Helium (He), in Cylinders, 99.9995%
SEMI C3.20 - Specification for Helium (He), in Cylinders, 99.9995% Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D01300 - SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks
SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D00500 - SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures
Education and Career Pathways (India)
Education and Career Pathways (India) Sale priceMember Price: $0.00
Non-Member Price: $0.00
From Wafer to Chip - The Basics of Semiconductor Manufacturing Asia 11/05
From Wafer to Chip The Basics of Semiconductor Manufacturing Asia 11/05 Sale priceMember Price: $99.00
Non-Member Price: $129.00