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P04800 - SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank
SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers
SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M00800 - SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers
SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07100 - SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI
SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI Sale priceMember Price: $144.00
Non-Member Price: $187.00
M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers
SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F03000 - SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site
F11300 - SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems
SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
F04700 - SEMI F47 - 半導体プロセス装置電圧サグ対応力のための仕様
SEMI F47 - 半導体プロセス装置電圧サグ対応力のための仕様 Sale priceMember Price: $334.00
Non-Member Price: $444.00
E06300 - SEMI E63 - Specification for 300 mm Box Opener/Loader to Tool Standard (BOLTS-M) Interface
E05400 - SEMI E54 - Specification for Sensor/Actuator Network
SEMI E54 - Specification for Sensor/Actuator Network Sale priceMember Price: $144.00
Non-Member Price: $187.00
E00500 - SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容(SECS-II)
E03001 - SEMI E30.1 - Specification for Inspection and Review Specific Equipment Model (ISEM)
SEMI E30.1 - Specification for Inspection and Review Specific Equipment Model (ISEM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E01700 - SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests
SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests Sale priceMember Price: $144.00
Non-Member Price: $187.00
E16300 - SEMI E163 - Guide for the Handling of Reticles and Other Extremely Electrostatic Sensitive (EES) Items Within Specially Designated Areas
E14800 - SEMI E148 - Specification for Time Synchronization and Definition of the TS-Clock Object
E11200 - SEMI E112 - Specification for a 150 mm Multiple Reticle SMIF Pod (MRSP150) Used to Transport and Store Multiple 6 Inch Reticles
C00305 - SEMI C3.5 - Standard for Nitrogen (N2), Bulk Liquid, 99.998% Quality
SEMI C3.5 - Standard for Nitrogen (N2), Bulk Liquid, 99.998% Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00349 - SEMI C3.49 - Standard for Bulk Nitrogen (N2), 99.99999% Quality
SEMI C3.49 - Standard for Bulk Nitrogen (N2), 99.99999% Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00343 - SEMI C3.43 - Standard for Hydrogen Fluoride (HF), Anhydrous (Provisional)
SEMI C3.43 - Standard for Hydrogen Fluoride (HF), Anhydrous (Provisional) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00329 - SEMI C3.29 - Standard for Nitrogen (N2), Bulk Gaseous, 99.9995% Quality
SEMI C3.29 - Standard for Nitrogen (N2), Bulk Gaseous, 99.9995% Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
C04600 - SEMI C46 - Guide for 25% Tetramethylammonium Hydroxide
SEMI C46 - Guide for 25% Tetramethylammonium Hydroxide Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08700 - SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry