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M07100 - SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI
SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI Sale priceMember Price: $148.00
Non-Member Price: $193.00
M06800 - SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD
SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD Sale priceMember Price: $148.00
Non-Member Price: $193.00
M06700 - SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics
SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics Sale priceMember Price: $148.00
Non-Member Price: $193.00
M06200 - SEMI M62 - Specification for Silicon Epitaxial Wafers
SEMI M62 - Specification for Silicon Epitaxial Wafers Sale price Member Price : $148.00
M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces Sale priceMember Price: $148.00
Non-Member Price: $193.00
M02300 - SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers
SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
G08700 - SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer
SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer Sale priceMember Price: $148.00
Non-Member Price: $193.00
F04900 - SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity
SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity Sale priceMember Price: $148.00
Non-Member Price: $193.00
F07200 - SEMI F72 - 不動態化処理した316Lステンレス鋼部品の接ガス表面の酸化膜のオージェ電子分光法（AES）による評価テスト方法
SEMI F72 - 不動態化処理した316Lステンレス鋼部品の接ガス表面の酸化膜のオージェ電子分光法（AES）による評価テスト方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
F09700 - SEMI F97 - Specification for Facility Package Integration, Monitoring and Control
SEMI F97 - Specification for Facility Package Integration, Monitoring and Control Sale priceMember Price: $148.00
Non-Member Price: $193.00
E08300 - SEMI E83 - Specification for PGV Mechanical Docking Flange
SEMI E83 - Specification for PGV Mechanical Docking Flange Sale priceMember Price: $148.00
Non-Member Price: $193.00
E07000 - SEMI E70 - Guide for Tool Accommodation Process
SEMI E70 - Guide for Tool Accommodation Process Sale priceMember Price: $148.00
Non-Member Price: $193.00
E01700 - SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests
SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests Sale priceMember Price: $148.00
Non-Member Price: $193.00
E11200 - SEMI E112 - Specification for a 150 mm Multiple Reticle SMIF Pod (MRSP150) Used to Transport and Store Multiple 6 Inch Reticles
SEMI E112 - Specification for a 150 mm Multiple Reticle SMIF Pod (MRSP150) Used to Transport and Store Multiple 6 Inch Reticles Sale priceMember Price: $148.00
Non-Member Price: $193.00
E11100 - SEMI E111 - Specification for a 150 mm Reticle SMIF Pod (RSP150) Used to Transport and Store a 6 Inch Reticle
SEMI E111 - Specification for a 150 mm Reticle SMIF Pod (RSP150) Used to Transport and Store a 6 Inch Reticle Sale priceMember Price: $148.00
Non-Member Price: $193.00
D06100 - SEMI D61 - Test Method of Perceptual Angle for OLED Displays
SEMI D61 - Test Method of Perceptual Angle for OLED Displays Sale priceMember Price: $148.00
Non-Member Price: $193.00
D04100 - SEMI D41 - Measurement Method of SEMI MURA in FPD Image Quality Inspection
SEMI D41 - Measurement Method of SEMI MURA in FPD Image Quality Inspection Sale priceMember Price: $148.00
Non-Member Price: $193.00
C08700 - SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry
SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry Sale priceMember Price: $148.00
Non-Member Price: $193.00
C08300 - SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting
SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting Sale priceMember Price: $148.00
Non-Member Price: $193.00
C07700 - SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm
SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm Sale priceMember Price: $148.00
Non-Member Price: $193.00
C05800 - SEMI C58 - Specification for Hydrogen
SEMI C58 - Specification for Hydrogen Sale priceMember Price: $148.00
Non-Member Price: $193.00
C05600 - SEMI C56 - Specification for Dichlorosilane (SiH2Cl2)
SEMI C56 - Specification for Dichlorosilane (SiH2Cl2) Sale priceMember Price: $148.00
Non-Member Price: $193.00
C02700 - SEMI C27 - Specification and Guide for Hydrochloric Acid
SEMI C27 - Specification and Guide for Hydrochloric Acid Sale priceMember Price: $148.00
Non-Member Price: $193.00
C01900 - SEMI C19 - Specification for Acetone
SEMI C19 - Specification for Acetone Sale priceMember Price: $148.00
Non-Member Price: $193.00