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M04600 - SEMI M46 - ECV法によりエピタキシァル層内のキャリア密度プロファイルを測定するための試験方法
M04400 - SEMI M44 - Guide to Conversion Factors for Interstitial Oxygen in Silicon
SEMI M44 - Guide to Conversion Factors for Interstitial Oxygen in Silicon Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04400 - SEMI M44 - シリコン中の酸素の換算係数ガイド
SEMI M44 - シリコン中の酸素の換算係数ガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M04200 - SEMI M42 - Specification for Compound Semiconductor Epitaxial Wafers
SEMI M42 - Specification for Compound Semiconductor Epitaxial Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04200 - SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様
SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M04100 - SEMI M41 - 電源デバイス/IC用シリコン・オン・インシュレーター(SOI)の仕様
M04000 - SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド
SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M03500 - SEMI M35 - 自動検査により検出されるシリコンウェーハ表面特性の仕様を開発するためのガイド
M02300 - SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers
SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M02100 - SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array
SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01700 - SEMI M17 - Guide for a Universal Wafer Grid
SEMI M17 - Guide for a Universal Wafer Grid Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01700 - SEMI M17 - 一般的なウェーハグリッドのガイド
SEMI M17 - 一般的なウェーハグリッドのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M01600 - SEMI M16 - Specification for Polycrystalline Silicon
SEMI M16 - Specification for Polycrystalline Silicon Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01600 - SEMI M16 - 多結晶シリコンの仕様
SEMI M16 - 多結晶シリコンの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
HB00900 - SEMI HB9 - Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED
HB00800 - SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal
SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal Sale priceMember Price: $144.00
Non-Member Price: $187.00
HB00700 - SEMI HB7 - Test Method for Measurement of Waviness of Crystalline Sapphire Wafers by Using Optical Probes
HB00600 - SEMI HB6 - Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers by Using Optical Probes
HB00500 - SEMI HB5 - Test Method for Measurement of Saw Marks on Crystalline Sapphire Wafers by Using Optical Probes
HB00400 - SEMI HB4 - Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI)
HB00300 - SEMI HB3 - Specification for the Mechanical Interface for 150 mm HB-LED Load Port
SEMI HB3 - Specification for the Mechanical Interface for 150 mm HB-LED Load Port Sale priceMember Price: $144.00
Non-Member Price: $187.00
HB00200 - SEMI HB2 - Specification for 150 mm Open Plastic and Metal Wafer Cassettes Intended for Use for Manufacturing HB-LED Devices
G09400 - SEMI G94 - Specification for Coin-Stack Type Tape Frame Shipping Container for 300 mm Wafer
G08900 - SEMI G89 - Specification for Leadframe Strip Size
SEMI G89 - Specification for Leadframe Strip Size Sale priceMember Price: $144.00
Non-Member Price: $187.00