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M06400 - SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy
SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy Sale priceMember Price: $148.00
Non-Member Price: $193.00
M05800 - SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes
SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes Sale priceMember Price: $148.00
Non-Member Price: $193.00
M05400 - SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters
SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters Sale priceMember Price: $148.00
Non-Member Price: $193.00
M05200 - SEMI M52 - Guide for Specifying Scanning Surface Inspection Systems for Silicon Wafers for the 130 nm to 5 nm Technology Generations
SEMI M52 - Guide for Specifying Scanning Surface Inspection Systems for Silicon Wafers for the 130 nm to 5 nm Technology Generations Sale price Member Price : $148.00
M04400 - SEMI M44 - Guide to Conversion Factors for Interstitial Oxygen in Silicon
SEMI M44 - Guide to Conversion Factors for Interstitial Oxygen in Silicon Sale priceMember Price: $148.00
Non-Member Price: $193.00
M04100 - SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs
SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs Sale priceMember Price: $148.00
Non-Member Price: $193.00
M01600 - SEMI M16 - Specification for Polycrystalline Silicon
SEMI M16 - Specification for Polycrystalline Silicon Sale priceMember Price: $148.00
Non-Member Price: $193.00
G06600 - SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds
SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds Sale priceMember Price: $148.00
Non-Member Price: $193.00
G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes
SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes Sale priceMember Price: $148.00
Non-Member Price: $193.00
G06300 - SEMI G63 - ダイ剪断強度の測定方法
SEMI G63 - ダイ剪断強度の測定方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
F02300 - SEMI F23 - Specification for Particle Concentration of Grade 10/0.2 Hydrogen
SEMI F23 - Specification for Particle Concentration of Grade 10/0.2 Hydrogen Sale priceMember Price: $148.00
Non-Member Price: $193.00
F05400 - SEMI F54 - Test Method for Measuring the Counting Efficiency of Condensation Nucleus Counters
SEMI F54 - Test Method for Measuring the Counting Efficiency of Condensation Nucleus Counters Sale priceMember Price: $148.00
Non-Member Price: $193.00
F02500 - SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases
SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases Sale priceMember Price: $148.00
Non-Member Price: $193.00
F02400 - SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases
SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases Sale priceMember Price: $148.00
Non-Member Price: $193.00
F11100 - SEMI F111 - Test Method for Equipment Fan Filter Unit (EFFU) Particle Removal
SEMI F111 - Test Method for Equipment Fan Filter Unit (EFFU) Particle Removal Sale priceMember Price: $148.00
Non-Member Price: $193.00
E09100 - SEMI E91 - Specification for Prober Specific Equipment Model (PSEM)
SEMI E91 - Specification for Prober Specific Equipment Model (PSEM) Sale price Member Price : $148.00
E08000 - SEMI E80 - Test Method for Determining Attitude Sensitivity of Mass Flow Controllers (Mounting Position)
SEMI E80 - Test Method for Determining Attitude Sensitivity of Mass Flow Controllers (Mounting Position) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E07700 - SEMI E77 - Test Method for Calculation of Conversion Factors for a Mass Flow Controller Using Surrogate Gases
SEMI E77 - Test Method for Calculation of Conversion Factors for a Mass Flow Controller Using Surrogate Gases Sale priceMember Price: $148.00
Non-Member Price: $193.00
E06700 - SEMI E67 - Test Method for Determining Reliability of Mass Flow Controller
SEMI E67 - Test Method for Determining Reliability of Mass Flow Controller Sale priceMember Price: $148.00
Non-Member Price: $193.00
E05404 - SEMI E54.4 - Specification for Sensor/Actuator Network Communications for DeviceNet
SEMI E54.4 - Specification for Sensor/Actuator Network Communications for DeviceNet Sale priceMember Price: $148.00
Non-Member Price: $193.00
E05424 - SEMI E54.24 - Specification for Sensor/Actuator Network Specific Device Model of a Generic Equipment Networked Sensor (GENsen)
SEMI E54.24 - Specification for Sensor/Actuator Network Specific Device Model of a Generic Equipment Networked Sensor (GENsen) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E05422 - SEMI E54.22 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pressure Gauges
SEMI E54.22 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pressure Gauges Sale priceMember Price: $148.00
Non-Member Price: $193.00
E02900 - SEMI E29 - Terminology for the Calibration of Mass Flow Controllers and Mass Flow Meters
SEMI E29 - Terminology for the Calibration of Mass Flow Controllers and Mass Flow Meters Sale priceMember Price: $148.00
Non-Member Price: $193.00
E02700 - SEMI E27 - Guide for Mass Flow Controller and Mass Flow Meter Linearity
SEMI E27 - Guide for Mass Flow Controller and Mass Flow Meter Linearity Sale priceMember Price: $148.00
Non-Member Price: $193.00
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