Standard All

testing

Filters

Price
to
Sort by:

1627 products

M02600 - SEMI M26 - Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers
M02400 - SEMI M24 - 鏡面単結晶プレミアムシリコンウェーハの仕様
SEMI M24 - 鏡面単結晶プレミアムシリコンウェーハの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M02400 - SEMI M24 - Specification for Polished Monocrystalline Silicon Premium Wafers
SEMI M24 - Specification for Polished Monocrystalline Silicon Premium Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M02300 - SEMI M23 - 鏡面単結晶インジウムリンウェーハの仕様
SEMI M23 - 鏡面単結晶インジウムリンウェーハの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M02200 - SEMI M22 - Specification for Dielectrically Isolated (DI) Wafers
SEMI M22 - Specification for Dielectrically Isolated (DI) Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M02100 - SEMI M21 - カーテシアン(デカルト)アレイにおける方形エレメントへの割当アドレスのガイド
M01900 - SEMI M19 - バルク・ガリウムヒ素単結晶基板の電気的性質(仕様)
SEMI M19 - バルク・ガリウムヒ素単結晶基板の電気的性質(仕様) Sale priceMember Price: $171.00
Non-Member Price: $224.00
M01900 - SEMI M19 - Specification for Electrical Properties of Bulk Gallium Arsenide Single Crystal Substrates
M01800 - SEMI M18 - シリコンウェーハ発注仕様書開発のガdイド
SEMI M18 - シリコンウェーハ発注仕様書開発のガdイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M01500 - SEMI M15 - 半絶縁ガリウムヒ素ウェーハ用の鏡面ウェーハの許容表面欠陥表
M01400 - SEMI M14 - 半絶縁ガリウムヒ素単結晶のためのイオン注入及び活性化プロセス(仕様)
M01400 - SEMI M14 - Specification for Ion Implantation and Activation Process for Semi-Insulating Gallium Arsenide Single Crystals
M01000 - SEMI M10 - ガリウムヒ素ウェーハに見られる構造及び特徴の確認のための標準名称
MS00900 - SEMI MS9 - Specification for High Density Permanent Connections Between Microfluidic Devices
MS00700 - SEMI MS7 - Specification for Microfluidic Interfaces to Electronic Device Packages
MS00600 - SEMI MS6 - Guide for Design and Materials for Interfacing Microfluidic Systems
MS00400 - SEMI MS4 - Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance
MS00200 - SEMI MS2 - Test Method for Step Height Measurements of Thin Films
SEMI MS2 - Test Method for Step Height Measurements of Thin Films Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS00100 - SEMI MS1 - Guide to Specifying Wafer-Wafer Bonding Alignment Targets
SEMI MS1 - Guide to Specifying Wafer-Wafer Bonding Alignment Targets Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS01000 - SEMI MS10 - Test Method to Measure Fluid Permeation Through MEMS Packaging Materials
SEMI MS10 - Test Method to Measure Fluid Permeation Through MEMS Packaging Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
E09100 - SEMI E91 - プローバ独自の装置モデル(PSEM)に関する仕様
SEMI E91 - プローバ独自の装置モデル(PSEM)に関する仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
E09000 - SEMI E90 - 基板トラッキングの仕様
SEMI E90 - 基板トラッキングの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
E08800 - SEMI E88 - AMHS保管SEM(ストッカーSEM)の仕様
SEMI E88 - AMHS保管SEM(ストッカーSEM)の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
E08700 - SEMI E87 - キャリア管理(CMS)のための仕様
SEMI E87 - キャリア管理(CMS)のための仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00