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SEMI M55 - 鏡面単結晶シリコンカーバイドウェーハの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M53 - パターンのない半導体ウェーハ表面上に証明済み手法で付着した単分散標準粒子を用いた走査型表面検査システム較正の作業方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M52 - 130 nm，90nm，65nmおよび45nm技術世代シリコンウェーハ用走査型表面検査装置仕様のためのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M50 - オーバーレイ法による走査型表面検査システム用捕獲率および偽計数率を決定するための試験方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M49 - 130 nmから65 nmへの技術世代のシリコンウェーハ用ジオメトリ測定システム規定のためのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M48 - Guide for Evaluating Chemical-Mechanical Polishing Processes of Films on Unpatterned Silicon Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M47 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M45 - 300 mmウェーハシッピングシステムに関する暫定仕様 Sale price Member Price : $171.00

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SEMI M43 - ウェーハナノポトグラフィを報告するためのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M4 - Specifications for SOS Epitaxial Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M38 - 鏡面リクレイムシリコンウェーハの仕様 Sale price Member Price : $171.00

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SEMI M37 - 低転位密度Inp基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M36 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Gallium Arsenide Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M34 - Guide for Specifying SIMOX Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M34 - SIMOXウェーハを規定するための指針 Sale priceMember Price: $171.00
Non-Member Price: $180.00

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SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF) Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M32 - 統計的仕様のガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M32 - Guide to Statistical Specifications Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M31 - 300 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy Sale priceMember Price: $144.00
Non-Member Price: $187.00