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SEMI E180 - 通过ICP-MS测量半导体晶圆加工过程中关键腔室部件表面金属污染的试验方法 Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范 Sale priceMember Price: $278.00
Non-Member Price: $369.00

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SEMI E187 - Specification for Cybersecurity of Fab Equipment Sale priceMember Price: $278.00
Non-Member Price: $369.00

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SEMI E44 - Guide for Procurment and Acceptance of Minienvironments Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI E185 - Specification for 300 mm Tape Frame FOUP Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI E184 - Specification for 300 mm Tape Frame FOUP Load Port Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI F119 - Test Method for Determining the Critical Pitting Temperature of Stainless Steel Surfaces Used in Corrosive Gas Systems by Use of a Ferric Chloride Solution Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI F118 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI E186 - Specification for Location and Dimensions for Power Connectors and Ethercat Ports in Mass Flow Controllers and Mass Flow Meters Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI F116 - Guide for Drain Segregation for Semiconductor Manufacturing Tools to Support Site Water Reuse Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI A4.1 - Specification for HTTP JSON Protocol Implementation for Tester Event Messaging for Semiconductors (TEMS) Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI D82 - Test Method for Viewing Angle of Flat Panel Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M90 - Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI D81 - Test Method for Dimming Properties of Flat Panel Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI E182 - Specification for Panel FOUP Loadport for Panel Level Packaging Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI A5 - Specification for Factory Operation Extension for SEMI A2 SMASH (SMASH-FOX) Sale priceMember Price: $144.00
Non-Member Price: $187.00