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SEMI D80 - Test Method for Measurement of Water Vapor Transmission Rate for High Gas Barrier Plastic Film in a Short Time Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays Sale priceMember Price: $144.00
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SEMI A4 - Specification for the Automated Test Equipment Tester Event Messaging for Semiconductors (TEMS) Sale priceMember Price: $144.00
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SEMI PV99 - Classification of Building Integrated Photovoltaic (BIPV) Sale priceMember Price: $144.00
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SEMI PV98 - Specification for Silicone Adhesive for the Back Rail Fixture on Photovoltaic (PV) Modules Sale priceMember Price: $144.00
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SEMI E181 - Specification for Panel FOUP for Panel Level Packaging Sale priceMember Price: $144.00
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SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process Sale priceMember Price: $144.00
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SEMI PV97 - Specification for Silicon Powder Used in Polysilicon Production Sale priceMember Price: $144.00
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SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing Sale priceMember Price: $144.00
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SEMI PV96 - Guide for the Design of Testing and Sorting Equipment for Crystalline Silicon Solar Cells Sale priceMember Price: $144.00
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SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance Sale priceMember Price: $144.00
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SEMI PV94 - Guide for Identifying Cell Defects In Crystalline Silicon Photovoltaic (PV) Modules By Electroluminescence (EL) Imaging Sale priceMember Price: $144.00
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SEMI S6 - 半導体製造装置の排気換気に関する環境，健康，安全のためのガイドライン Sale priceMember Price: $334.00
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SEMI PV93 - Test Method for Accelerated Cell Level Testing for Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility of Solar Cells Sale priceMember Price: $144.00
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SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: $144.00
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SEMI E179 - Specification for Protocol Buffers Common Components Sale priceMember Price: $144.00
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SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components Sale priceMember Price: $144.00
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SEMI F114 - Test Method for the Determination of Organic Contaminants Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components Sale priceMember Price: $144.00
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SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices Sale priceMember Price: $144.00
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SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules Sale priceMember Price: $144.00
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SEMI E178 - Guide for EDA Freeze Version Sale priceMember Price: $144.00
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SEMI HB12 - Specification for Dry-Etched Patterned Sapphire Substrates (DPSS) Sale priceMember Price: $144.00
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SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI 3D22 - Guide on Measurements of Openings and Vias in Glass Sale priceMember Price: $144.00
Non-Member Price: $187.00