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2229 products

M01500 - SEMI M15 - 半絶縁ガリウムヒ素ウェーハ用の鏡面ウェーハの許容表面欠陥表
M01500 - SEMI M15 - Polished Wafer Defect Limits Table for Semi-Insulating Gallium Arsenide Wafers
M01400 - SEMI M14 - 半絶縁ガリウムヒ素単結晶のためのイオン注入及び活性化プロセス(仕様)
M01400 - SEMI M14 - Specification for Ion Implantation and Activation Process for Semi-Insulating Gallium Arsenide Single Crystals
M01300 - SEMI M13 - シリコンウェーハの英数字マーキングの仕様
SEMI M13 - シリコンウェーハの英数字マーキングの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M01200 - SEMI M12 - ウェーハ表面の連続英数字マーキングの仕様
SEMI M12 - ウェーハ表面の連続英数字マーキングの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M01000 - SEMI M10 - ガリウムヒ素ウェーハに見られる構造及び特徴の確認のための標準名称
M00100 - SEMI M1 - 鏡面単結晶シリコンウェーハの仕様
SEMI M1 - 鏡面単結晶シリコンウェーハの仕様 Sale priceMember Price: $334.00
Non-Member Price: $444.00
MS00900 - SEMI MS9 - Specification for High Density Permanent Connections Between Microfluidic Devices
MS00700 - SEMI MS7 - Specification for Microfluidic Interfaces to Electronic Device Packages
MS00600 - SEMI MS6 - Guide for Design and Materials for Interfacing Microfluidic Systems
MS00800 - SEMI MS8 - Guide to Evaluating Hermeticity of Microelectromechanical Systems (MEMS) Packages
MS00500 - SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures
MS00400 - SEMI MS4 - Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance
MS00300 - SEMI MS3 - Terminology for MEMS Technology
SEMI MS3 - Terminology for MEMS Technology Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS00200 - SEMI MS2 - Test Method for Step Height Measurements of Thin Films
SEMI MS2 - Test Method for Step Height Measurements of Thin Films Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS01100 - SEMI MS11 - Specification for Microfluidic Port and Pitch Dimensions
SEMI MS11 - Specification for Microfluidic Port and Pitch Dimensions Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS00100 - SEMI MS1 - Guide to Specifying Wafer-Wafer Bonding Alignment Targets
SEMI MS1 - Guide to Specifying Wafer-Wafer Bonding Alignment Targets Sale priceMember Price: $144.00
Non-Member Price: $187.00
MS01000 - SEMI MS10 - Test Method to Measure Fluid Permeation Through MEMS Packaging Materials
SEMI MS10 - Test Method to Measure Fluid Permeation Through MEMS Packaging Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
E09900 - SEMI E99 - キャリアIDリーダ/ライタ機能スタンダード:コンセプト,挙動,およびサービスに関する仕様
E09100 - SEMI E91 - プローバ独自の装置モデル(PSEM)に関する仕様
SEMI E91 - プローバ独自の装置モデル(PSEM)に関する仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
E09000 - SEMI E90 - 기판 추적 사양
SEMI E90 - 기판 추적 사양 Sale priceMember Price: $144.00
Non-Member Price: $187.00
E09000 - SEMI E90 - 基板トラッキングの仕様
SEMI E90 - 基板トラッキングの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
E08800 - SEMI E88 - AMHS保管SEM(ストッカーSEM)の仕様
SEMI E88 - AMHS保管SEM(ストッカーSEM)の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00