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2229 products

M04100 - SEMI M41 - 電源デバイス/IC用シリコン・オン・インシュレーター(SOI)の仕様
M04100 - SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs
SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04000 - SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers
SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04000 - SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド
SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers
SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M03500 - SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection
M03500 - SEMI M35 - 自動検査により検出されるシリコンウェーハ表面特性の仕様を開発するためのガイド
M03100 - SEMI M31 - Specification for Mechanical Features of Front-Opening Shipping Box Used to Transport and Ship 300 mm Wafers
M02300 - SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers
SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M02100 - SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array
SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array Sale priceMember Price: $144.00
Non-Member Price: $187.00
M02000 - SEMI M20 - Practice for Establishing a Wafer Coordinate System
SEMI M20 - Practice for Establishing a Wafer Coordinate System Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01700 - SEMI M17 - Guide for a Universal Wafer Grid
SEMI M17 - Guide for a Universal Wafer Grid Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01700 - SEMI M17 - 一般的なウェーハグリッドのガイド
SEMI M17 - 一般的なウェーハグリッドのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
M01600 - SEMI M16 - Specification for Polycrystalline Silicon
SEMI M16 - Specification for Polycrystalline Silicon Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01600 - SEMI M16 - 多結晶シリコンの仕様
SEMI M16 - 多結晶シリコンの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M01300 - SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers
SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01200 - SEMI M12 - Specification for Serial Alphanumeric Marking of Silicon Wafers
SEMI M12 - Specification for Serial Alphanumeric Marking of Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M00100 - SEMI M1 - Specification for Polished Single Crystal Silicon Wafers
SEMI M1 - Specification for Polished Single Crystal Silicon Wafers Sale priceMember Price: $278.00
Non-Member Price: $369.00
M01000 - SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers
HB00900 - SEMI HB9 - Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED
HB00800 - SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal
SEMI HB8 - Test Method for Determining Orientation of a Sapphire Single Crystal Sale priceMember Price: $144.00
Non-Member Price: $187.00
HB00700 - SEMI HB7 - Test Method for Measurement of Waviness of Crystalline Sapphire Wafers by Using Optical Probes
HB00600 - SEMI HB6 - Test Method for Measurement of Thickness and Shape of Crystalline Sapphire Wafers by Using Optical Probes
HB00500 - SEMI HB5 - Test Method for Measurement of Saw Marks on Crystalline Sapphire Wafers by Using Optical Probes