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F07200 - SEMI F72 - 不動態化処理した316Lステンレス鋼部品の接ガス表面の酸化膜のオージェ電子分光法（AES）による評価テスト方法
SEMI F72 - 不動態化処理した316Lステンレス鋼部品の接ガス表面の酸化膜のオージェ電子分光法（AES）による評価テスト方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
F05900 - SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves
SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves Sale priceMember Price: $144.00
Non-Member Price: $187.00
F07400 - SEMI F74 - Test Method for the Performance and Evaluation of Metal Seal Designs for Use in Gas Delivery Systems
SEMI F74 - Test Method for the Performance and Evaluation of Metal Seal Designs for Use in Gas Delivery Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
F09700 - SEMI F97 - Specification for Facility Package Integration, Monitoring and Control
SEMI F97 - Specification for Facility Package Integration, Monitoring and Control Sale priceMember Price: $144.00
Non-Member Price: $187.00
E08300 - SEMI E83 - Specification for PGV Mechanical Docking Flange
SEMI E83 - Specification for PGV Mechanical Docking Flange Sale priceMember Price: $144.00
Non-Member Price: $187.00
E07800 - SEMI E78 - 装置のための静電気放電（ESD）と静電気吸着（ESA）の評価と管理へのガイド
SEMI E78 - 装置のための静電気放電（ESD）と静電気吸着（ESA）の評価と管理へのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
E03005 - SEMI E30.5 - Specification for Metrology Specific Equipment Model (MSEM)
SEMI E30.5 - Specification for Metrology Specific Equipment Model (MSEM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E15700 - SEMI E157 - Specification for Module Process TrackingE15700 - SEMI E157 - Specification for Module Process Tracking
SEMI E157 - Specification for Module Process Tracking Sale priceMember Price: $144.00
Non-Member Price: $187.00
E13500 - SEMI E135 - Test Method for RF Generators to Determine Transient Response for RF Power Delivery Systems Used in Semiconductor Processing Equipment
SEMI E135 - Test Method for RF Generators to Determine Transient Response for RF Power Delivery Systems Used in Semiconductor Processing Equipment Sale priceMember Price: $144.00
Non-Member Price: $187.00
E12200 - SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM)
SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E11700 - SEMI E117 - Specification for Reticle Load Port
SEMI E117 - Specification for Reticle Load Port Sale priceMember Price: $144.00
Non-Member Price: $187.00
E10900 - SEMI E109 - Specification for Reticle and Pod Management (RPMS)
SEMI E109 - Specification for Reticle and Pod Management (RPMS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
D06100 - SEMI D61 - Test Method of Perceptual Angle for OLED Displays
SEMI D61 - Test Method of Perceptual Angle for OLED Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
D04100 - SEMI D41 - Measurement Method of SEMI MURA in FPD Image Quality Inspection
SEMI D41 - Measurement Method of SEMI MURA in FPD Image Quality Inspection Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08900 - SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS)
SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08300 - SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting
SEMI C83 - Test Method for Tensile Strength Applied to Welded Connections Made by PFA Weld Fitting Sale priceMember Price: $144.00
Non-Member Price: $187.00
C07700 - SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm
SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm Sale priceMember Price: $144.00
Non-Member Price: $187.00
C05600 - SEMI C56 - Specification for Dichlorosilane (SiH2Cl2)
SEMI C56 - Specification for Dichlorosilane (SiH2Cl2) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C03600 - SEMI C36 - Specification for Phosphoric Acid
SEMI C36 - Specification for Phosphoric Acid Sale priceMember Price: $144.00
Non-Member Price: $187.00
C02700 - SEMI C27 - Specification and Guide for Hydrochloric Acid
SEMI C27 - Specification and Guide for Hydrochloric Acid Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D00700 - SEMI 3D7 - Guide for Alignment Mark for 3DS-IC Process
SEMI 3D7 - Guide for Alignment Mark for 3DS-IC Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
F12000 - SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems
SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
F00200 - SEMI F2 - Specification for 316L Stainless Steel Tubing for General Purpose Semiconductor Manufacturing Applications
SEMI F2 - Specification for 316L Stainless Steel Tubing for General Purpose Semiconductor Manufacturing Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17900 - SEMI E179 - Specification for Protocol Buffers Common Components
SEMI E179 - Specification for Protocol Buffers Common Components Sale priceMember Price: $144.00
Non-Member Price: $187.00