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HB00100 - SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
HB01000 - SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers
SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G06400 - SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd)
SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd) Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08200 - SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process
SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08700 - SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer
SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05500 - SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers
SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F06400 - SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers
SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F07600 - SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas
SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas Sale priceMember Price: $144.00
Non-Member Price: $187.00
F02800 - SEMI F28 - Test Method for Measuring Particle Generation from Process PanelsF02800 - SEMI F28 - Test Method for Measuring Particle Generation from Process Panels
SEMI F28 - Test Method for Measuring Particle Generation from Process Panels Sale priceMember Price: $144.00
Non-Member Price: $187.00
F04900 - SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity
SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity Sale priceMember Price: $144.00
Non-Member Price: $187.00
F06700 - SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity
SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity Sale priceMember Price: $144.00
Non-Member Price: $187.00
E07000 - SEMI E70 - Guide for Tool Accommodation Process
SEMI E70 - Guide for Tool Accommodation Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
E05420 - SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT®
SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT® Sale priceMember Price: $144.00
Non-Member Price: $187.00
E04300 - SEMI E43 - 物体および表面上の静電気測定のためのガイド
SEMI E43 - 物体および表面上の静電気測定のためのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
E02800 - SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller
SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17200 - SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD)
SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD) Sale price Member Price : $144.00
E01600 - SEMI E16 - Guide for Determining and Describing Mass Flow Controller Leak Rates
SEMI E16 - Guide for Determining and Describing Mass Flow Controller Leak Rates Sale priceMember Price: $144.00
Non-Member Price: $187.00
E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling
SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling Regular price$300.00 USD Sale price$187.00 USD
E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port
SEMI E154 - Specification for Mechanical Features of 450 mm Load Port Regular price$300.00 USD Sale price$187.00 USD
E11300 - SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems
SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
E11100 - SEMI E111 - Specification for a 150 mm Reticle SMIF Pod (RSP150) Used to Transport and Store a 6 Inch Reticle
SEMI E111 - Specification for a 150 mm Reticle SMIF Pod (RSP150) Used to Transport and Store a 6 Inch Reticle Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07800 - SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices
SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07500 - SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display
SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display Sale priceMember Price: $144.00
Non-Member Price: $187.00
D05700 - SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection
SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection Sale priceMember Price: $144.00
Non-Member Price: $187.00