Individual Standards

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1213 products

G08500 - SEMI G85 - マップデータ・フォーマット用仕様
SEMI G85 - マップデータ・フォーマット用仕様 Sale price Member Price : $171.00
G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment
SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Sale priceMember Price: $144.00
Non-Member Price: $187.00
G00800 - SEMI G8 - Test Method for Gold Plating
SEMI G8 - Test Method for Gold Plating Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07900 - SEMI G79 - Specification for Overall Digital Timing Accuracy
SEMI G79 - Specification for Overall Digital Timing Accuracy Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07600 - SEMI G76 - Specification for Polyimide-Based Adhesive Tape Used in Tape Carrier Packages (TCP)
SEMI G76 - Specification for Polyimide-Based Adhesive Tape Used in Tape Carrier Packages (TCP) Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07200 - SEMI G72 - Specification for Ball Grid Array Design Library
SEMI G72 - Specification for Ball Grid Array Design Library Sale priceMember Price: $144.00
Non-Member Price: $187.00
G05800 - SEMI G58 - Specification for Cerquad Package Constructions
SEMI G58 - Specification for Cerquad Package Constructions Sale priceMember Price: $144.00
Non-Member Price: $187.00
G01900 - SEMI G19 - Specification for Dip Leadframes Produced by Etching
SEMI G19 - Specification for Dip Leadframes Produced by Etching Sale priceMember Price: $144.00
Non-Member Price: $187.00
G03200 - SEMI G32 - Guideline for Unencapsulated Thermal Test Chip
SEMI G32 - Guideline for Unencapsulated Thermal Test Chip Sale priceMember Price: $144.00
Non-Member Price: $187.00
G03000 - SEMI G30 - Test Method for Junction-to-Case Thermal Resistance Measurements of Ceramic Packages
SEMI G30 - Test Method for Junction-to-Case Thermal Resistance Measurements of Ceramic Packages Sale priceMember Price: $144.00
Non-Member Price: $187.00
C03900 - SEMI C39 - Specification for Potassium Hydroxide Pellets
SEMI C39 - Specification for Potassium Hydroxide Pellets Sale priceMember Price: $144.00
Non-Member Price: $187.00
C03800 - SEMI C38 - Guide for Phosphorus Oxychloride
SEMI C38 - Guide for Phosphorus Oxychloride Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV00400 - SEMI PV4 - Specification for Range of 5th Generation Substrate Sizes for Thin Film Photovoltaic Applications
SEMI PV4 - Specification for Range of 5th Generation Substrate Sizes for Thin Film Photovoltaic Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
P00800 - SEMI P8 - Test Method for the Determination of Water in Photoresist
SEMI P8 - Test Method for the Determination of Water in Photoresist Sale priceMember Price: $144.00
Non-Member Price: $187.00
P00700 - SEMI P7 - Test Method of Viscosity Determination, Method A - Kinematic Viscosity
SEMI P7 - Test Method of Viscosity Determination, Method A - Kinematic Viscosity Sale priceMember Price: $144.00
Non-Member Price: $187.00
P00600 - SEMI P6 - フォトマスク用レジストレーションマーク
SEMI P6 - フォトマスク用レジストレーションマーク Sale priceMember Price: $171.00
Non-Member Price: $224.00
P00600 - SEMI P6 - Specification for Registration Marks for Photomasks
SEMI P6 - Specification for Registration Marks for Photomasks Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04700 - SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness
SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04600 - SEMI P46 - Specification for Critical Dimension (CD) Measurement Information Data on Photomask by XML
SEMI P46 - Specification for Critical Dimension (CD) Measurement Information Data on Photomask by XML Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04300 - SEMI P43 - Photomask Qualification Terminology
SEMI P43 - Photomask Qualification Terminology Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04200 - SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様
SEMI P42 - ウェーハ露光システムへの自動レシピ伝送のためのレチクルデータの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P04200 - SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System
SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04100 - SEMI P41 - XMLによる，検査装置，修正装置およびレビュー装置間で取扱うマスク欠陥データ仕様
SEMI P41 - XMLによる，検査装置，修正装置およびレビュー装置間で取扱うマスク欠陥データ仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P04100 - SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools
SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools Sale priceMember Price: $144.00
Non-Member Price: $187.00
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