Individual Standards
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1208 products
SEMI P13 - Determination of Sodium and Potassium in Positive Photoresists by Atomic Absorption Spectroscopy
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Non-Member Price: $180.00
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SEMI P12 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト中の鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，及びニッケルの測定
Sale priceMember Price: $164.00
Non-Member Price: $215.00
Non-Member Price: $215.00
SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP)
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI P11 - Test Method for Determination of Total Normality for Alkaline Developer Solutions
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI P11 - アルカリ現像溶液に対する全規定度の測定のテスト方法
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Non-Member Price: $215.00
Non-Member Price: $215.00
SEMI P1 - ハードサーフェス・フォトマスク用基板
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SEMI P1 - Specification for Hard Surface Photomask Substrates
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI P10 - Specification of Data Structures for Photomask Orders
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI 3D20 - Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications
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SEMI S30 - Safety Guideline for Use of Energetic Materials in Semiconductor R&D and Manufacturing Processes
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Non-Member Price: $355.00
Non-Member Price: $355.00
SEMI G84 - Specification for Strip Map Protocol
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI F71 - ガス供給システムの温度サイクル試験方法
Regular price$300.00 USD
Sale price$215.00 USD
SEMI M76 - 開発用直径450 mmシリコン単結晶鏡面ウェーハの仕様
Regular price$360.00 USD
Sale price$215.00 USD
SEMI M76 - Specification for Developmental 450 mm Diameter Polished Single Crystal Silicon Wafers
Regular price$300.00 USD
Sale price$180.00 USD
SEMI M49 - 130 nmから65 nmへの技術世代のシリコンウェーハ用ジオメトリ測定システム規定のためのガイド
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Non-Member Price: $215.00
Non-Member Price: $215.00
SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法
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Non-Member Price: $215.00
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SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI M37 - 低転位密度Inp基板のエッチピット密度（EPD）測定方法
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Non-Member Price: $215.00
Non-Member Price: $215.00
SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI M36 - 低転位密度GaAs基板のエッチピット密度（EPD）測定方法
Sale priceMember Price: $164.00
Non-Member Price: $215.00
Non-Member Price: $215.00
SEMI M36 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Gallium Arsenide Wafers
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Non-Member Price: $180.00
Non-Member Price: $180.00
SEMI M26 - ウェーハの運搬に使用される100 mm，125 mm，150 mm，200 mmウェーハシッピングボックスの再利用ガイド
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Non-Member Price: $215.00
Non-Member Price: $215.00
SEMI M19 - バルク・ガリウムヒ素単結晶基板の電気的性質（仕様）
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Non-Member Price: $215.00
Non-Member Price: $215.00