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E19200 - SEMI E192 - Guide for Equipment Adoption Criteria for GEM and GEM-related Standards
SEMI E192 - Guide for Equipment Adoption Criteria for GEM and GEM-related Standards Sale priceMember Price:
Non-Member Price: $187.00
E09001 - SEMI E90.1 - Specification for SECS-II Protocol Substrate Tracking
SEMI E90.1 - Specification for SECS-II Protocol Substrate Tracking Sale priceMember Price: $144.00
Non-Member Price: $187.00
E12502 - SEMI E125.2 - Specification for Protocol Buffers for Equipment Self Description (EQSD)
SEMI E125.2 - Specification for Protocol Buffers for Equipment Self Description (EQSD) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E12002 - SEMI E120.2 - Specification for Protocol Buffers for Common Equipment Model (CEM)
SEMI E120.2 - Specification for Protocol Buffers for Common Equipment Model (CEM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19001 - SEMI E190.1 - Specification for Common Data for Etch Components
SEMI E190.1 - Specification for Common Data for Etch Components Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19000 - SEMI E190 - Specification for Equipment Data Publication (EDP)
SEMI E190 - Specification for Equipment Data Publication (EDP) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19101 - SEMI E191.1 - Specification for SECS-II Protocol for Computing Device Cybersecurity Status Reporting
SEMI E191.1 - Specification for SECS-II Protocol for Computing Device Cybersecurity Status Reporting Sale priceMember Price: $278.00
Non-Member Price: $369.00
E19100 - SEMI E191 - Specification for Computing Device Cybersecurity Status Reporting
SEMI E191 - Specification for Computing Device Cybersecurity Status Reporting Sale priceMember Price: $278.00
Non-Member Price: $369.00
FH00400 - SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products
SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products Sale priceMember Price: $144.00
Non-Member Price: $187.00
D08500 - SEMI D85 - Guide for the Tone Reproduction Curves for Transparent Displays
SEMI D85 - Guide for the Tone Reproduction Curves for Transparent Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
E13402 - SEMI E134.2 - Specification for Protocol Buffers of Data Collection Management
SEMI E134.2 - Specification for Protocol Buffers of Data Collection Management Sale priceMember Price: $144.00
Non-Member Price: $187.00
E13202 - SEMI E132.2 - Specification for Protocol Buffers for Equipment Client Authentication and Authorization (ECA)
SEMI E132.2 - Specification for Protocol Buffers for Equipment Client Authentication and Authorization (ECA) Sale priceMember Price: $144.00
Non-Member Price: $187.00
D08600 - SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays
SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
E18900 - SEMI E189 - Specification for Equipment Management of Consumables and Durables (EMCD)
SEMI E189 - Specification for Equipment Management of Consumables and Durables (EMCD) Sale priceMember Price: $144.00
Non-Member Price: $187.00
T02500 - SEMI T25 - Specification for Blockchain for Semiconductor Supply Chain Traceability
SEMI T25 - Specification for Blockchain for Semiconductor Supply Chain Traceability Sale priceMember Price: $144.00
Non-Member Price: $187.00
FH00300 - SEMI FH3 - Guide for Salt Mist and Washability Test Flow for Control Module Connector of Wearables
SEMI FH3 - Guide for Salt Mist and Washability Test Flow for Control Module Connector of Wearables Sale priceMember Price: $144.00
Non-Member Price: $187.00
D08400 - SEMI D84 - Terminology for FPD Phase Shift Mask and Mask Blanks
SEMI D84 - Terminology for FPD Phase Shift Mask and Mask Blanks Sale priceMember Price: $144.00
Non-Member Price: $187.00
M09300 - SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging
SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging Sale priceMember Price: $144.00
Non-Member Price: $187.00
C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA)
SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) Sale priceMember Price: $144.00
Non-Member Price: $187.00
F12100 - SEMI F121 - Guide for Evaluating Metrology for Particle Precursors in Ultrapure Water
SEMI F121 - Guide for Evaluating Metrology for Particle Precursors in Ultrapure Water Sale priceMember Price: $278.00
Non-Member Price: $369.00
PV10100 - SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building
SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04900 - SEMI P49 - Specification for Experimental Curvilinear Multigon Extension to SEMI P39
SEMI P49 - Specification for Experimental Curvilinear Multigon Extension to SEMI P39 Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV09800 - SEMI PV100 - Test Method of Wind Uplift Resistance for Photovoltaic Modules Roof (BIPV)
SEMI PV100 - Test Method of Wind Uplift Resistance for Photovoltaic Modules Roof (BIPV) Sale priceMember Price: $144.00
Non-Member Price: $187.00
M09200 - SEMI M92 - Specification for 4H-SIC Homoepitaxial Wafer
SEMI M92 - Specification for 4H-SIC Homoepitaxial Wafer Sale priceMember Price: $144.00
Non-Member Price: $187.00
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