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P01900 - SEMI P19 - Specification for Metrology Pattern Cells for Integrated Circuit Manufacture
P01800 - SEMI P18 - Specification for Overlay Capabilities of Wafer Steppers
SEMI P18 - Specification for Overlay Capabilities of Wafer Steppers Sale priceMember Price: $144.00
Non-Member Price: $187.00
P01800 - SEMI P18 - ウェーハステッパーのオーバーレイ能力
SEMI P18 - ウェーハステッパーのオーバーレイ能力 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P01700 - SEMI P17 - 誘導結合プラズマ発光分光法(ICP)によるポジティブ・フォトレジスト・メタルイオンフリー(MIF)現像液における鉄,亜鉛,カルシウム,マグネシウム,銅,ホウ素,アルミニウム,クロム,マンガン,およびニッケルの測定
P01700 - SEMI P17 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresist Metal Ion Free (MIF) Developers by Inductively Coupled Plasma Emission Spectroscopy (ICP)
P01600 - SEMI P16 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー(MIF)現像液中の錫の測定
P01600 - SEMI P16 - Determination of Tin in Positive Photoresist Metal Ion Free (MIF) Developers by Graphite Furnace Atomic Absorption Spectroscopy
P01500 - SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー(MIF)現像液中のナトリウムとカリウムの測定
P01500 - SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy
P01400 - SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定
P01400 - SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy
P01300 - SEMI P13 - 原子吸光分光法によるポジティブフォトレジスト中におけるナトリウムとカリウムの測定
P01300 - SEMI P13 - Determination of Sodium and Potassium in Positive Photoresists by Atomic Absorption Spectroscopy
P01200 - SEMI P12 - 誘導結合プラズマ発光分光法(ICP)によるポジティブ・フォトレジスト中の鉄,亜鉛,カルシウム,マグネシウム,銅,ホウ素,アルミニウム,クロム,マンガン,及びニッケルの測定
P01200 - SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP)
P01100 - SEMI P11 - Test Method for Determination of Total Normality for Alkaline Developer Solutions
P01100 - SEMI P11 - アルカリ現像溶液に対する全規定度の測定のテスト方法
SEMI P11 - アルカリ現像溶液に対する全規定度の測定のテスト方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P00100 - SEMI P1 - ハードサーフェス・フォトマスク用基板
SEMI P1 - ハードサーフェス・フォトマスク用基板 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P00100 - SEMI P1 - Specification for Hard Surface Photomask Substrates
SEMI P1 - Specification for Hard Surface Photomask Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
P01000 - SEMI P10 - Specification of Data Structures for Photomask Orders
SEMI P10 - Specification of Data Structures for Photomask Orders Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D02000 - SEMI 3D20 - Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications
S03000 - SEMI S30 - Safety Guideline for Use of Energetic Materials in Semiconductor R&D and Manufacturing Processes
G08400 - SEMI G84 - Specification for Strip Map Protocol
SEMI G84 - Specification for Strip Map Protocol Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D01900 - SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling
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