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P01600 - SEMI P16 - Determination of Tin in Positive Photoresist Metal Ion Free (MIF) Developers by Graphite Furnace Atomic Absorption Spectroscopy
SEMI P16 - Determination of Tin in Positive Photoresist Metal Ion Free (MIF) Developers by Graphite Furnace Atomic Absorption Spectroscopy Sale priceMember Price: $148.00
Non-Member Price: $193.00
P01500 - SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中のナトリウムとカリウムの測定
SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中のナトリウムとカリウムの測定 Sale priceMember Price: $176.00
Non-Member Price: $231.00
P01500 - SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy
SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy Sale priceMember Price: $148.00
Non-Member Price: $193.00
P01400 - SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定
SEMI P14 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト中の錫の測定 Sale priceMember Price: $176.00
Non-Member Price: $231.00
P01400 - SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy
SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy Sale priceMember Price: $148.00
Non-Member Price: $193.00
P01300 - SEMI P13 - 原子吸光分光法によるポジティブフォトレジスト中におけるナトリウムとカリウムの測定
SEMI P13 - 原子吸光分光法によるポジティブフォトレジスト中におけるナトリウムとカリウムの測定 Sale priceMember Price: $176.00
Non-Member Price: $231.00
P01300 - SEMI P13 - Determination of Sodium and Potassium in Positive Photoresists by Atomic Absorption Spectroscopy
SEMI P13 - Determination of Sodium and Potassium in Positive Photoresists by Atomic Absorption Spectroscopy Sale priceMember Price: $148.00
Non-Member Price: $193.00
P01200 - SEMI P12 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト中の鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，及びニッケルの測定
SEMI P12 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト中の鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，及びニッケルの測定 Sale priceMember Price: $176.00
Non-Member Price: $231.00
P01200 - SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP)
SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP) Sale priceMember Price: $148.00
Non-Member Price: $193.00
P01100 - SEMI P11 - Test Method for Determination of Total Normality for Alkaline Developer Solutions
SEMI P11 - Test Method for Determination of Total Normality for Alkaline Developer Solutions Sale priceMember Price: $148.00
Non-Member Price: $193.00
P01100 - SEMI P11 - アルカリ現像溶液に対する全規定度の測定のテスト方法
SEMI P11 - アルカリ現像溶液に対する全規定度の測定のテスト方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
P00100 - SEMI P1 - ハードサーフェス・フォトマスク用基板
SEMI P1 - ハードサーフェス・フォトマスク用基板 Sale priceMember Price: $176.00
Non-Member Price: $231.00
P00100 - SEMI P1 - Specification for Hard Surface Photomask Substrates
SEMI P1 - Specification for Hard Surface Photomask Substrates Sale priceMember Price: $148.00
Non-Member Price: $193.00
P01000 - SEMI P10 - Specification of Data Structures for Photomask Orders
SEMI P10 - Specification of Data Structures for Photomask Orders Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D02000 - SEMI 3D20 - Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications
SEMI 3D20 - Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications Sale priceMember Price: $148.00
Non-Member Price: $193.00
S03000 - SEMI S30 - Safety Guideline for Use of Energetic Materials in Semiconductor R&D and Manufacturing Processes
SEMI S30 - Safety Guideline for Use of Energetic Materials in Semiconductor R&D and Manufacturing Processes Sale priceMember Price: $286.00
Non-Member Price: $380.00
G08400 - SEMI G84 - Specification for Strip Map Protocol
SEMI G84 - Specification for Strip Map Protocol Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D01900 - SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling
SEMI 3D19 - Test Method for Adhesive Strength of Adhesive Tray Used for Thin Chip Handling Sale priceMember Price: $148.00
Non-Member Price: $193.00
F07100 - SEMI F71 - ガス供給システムの温度サイクル試験方法
SEMI F71 - ガス供給システムの温度サイクル試験方法 Regular price$300.00 USD Sale price$231.00 USD
F02100 - SEMI F21 - 清浄な環境における空気を媒体とする分子汚染レベルの分類
SEMI F21 - 清浄な環境における空気を媒体とする分子汚染レベルの分類 Sale priceMember Price: $176.00
Non-Member Price: $231.00
F03400 - SEMI F34 - 液体化学薬品配管ラベリングに関するガイド
SEMI F34 - 液体化学薬品配管ラベリングに関するガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
F04200 - SEMI F42 - Test Method for Semiconductor Processing Equipment Voltage Sag Immunity
SEMI F42 - Test Method for Semiconductor Processing Equipment Voltage Sag Immunity Sale priceMember Price: $148.00
Non-Member Price: $193.00
F01700 - SEMI F17 - Specification for High Purity Quality Electropolished 316L Stainless Steel Tubing, Component Tube Stubs, and Fittings Made from Tubing
SEMI F17 - Specification for High Purity Quality Electropolished 316L Stainless Steel Tubing, Component Tube Stubs, and Fittings Made from Tubing Sale priceMember Price: $148.00
Non-Member Price: $193.00
F04500 - SEMI F45 - 機械加工されたステンレス鋼製異径溶接継手の仕様
SEMI F45 - 機械加工されたステンレス鋼製異径溶接継手の仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00