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testing

1629 products

E14300 - SEMI E143 - Test Method for Measuring Power and Variation into a 50-Ω Load and Power Variation and Spectrum into a Load with a VSWR of 2.0 at any phase Angle
E14000 - SEMI E140 - Guide to Calculate Cost of Ownership (COO) Metrics for Gas Delivery Systems
E13600 - SEMI E136 - Test Method for Determining the Output Power of RF Generators Used in Semiconductor Processing Equipment RF Power Delivery Systems
E13400 - SEMI E134 - 데이터 수집 관리 사양
SEMI E134 - 데이터 수집 관리 사양 Sale priceMember Price: $144.00
Non-Member Price: $187.00
E13000 - SEMI E130 - Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300)
E12900 - SEMI E129 - 半導体製造設備における静電気放電(ESD)の評価と制御へのガイド
E12800 - SEMI E128 - XML メッセージ構造に関する仕様
SEMI E128 - XML メッセージ構造に関する仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
E12500 - SEMI E125 - EQUIPMENT SELF DESCRIPTION 사양
SEMI E125 - EQUIPMENT SELF DESCRIPTION 사양 Sale priceMember Price: $144.00
Non-Member Price: $187.00
E12300 - SEMI E123 - ハンドラ装置の特定装置モデル(HSEM)のスタンダード
SEMI E123 - ハンドラ装置の特定装置モデル(HSEM)のスタンダード Sale priceMember Price: $171.00
Non-Member Price: $224.00
E01200 - SEMI E12 - Guide for Standardized Pressure, Temperature, Density, and Flow Units Used in Mass Flow Meters and Mass Flow Controllers
E12100 - SEMI E121 - Guide for Style and Usage of XML for Semiconductor Manufacturing Applications
E12000 - SEMI E120 - COMMON EQUIPMENT MODEL 사양
SEMI E120 - COMMON EQUIPMENT MODEL 사양 Sale priceMember Price: $144.00
Non-Member Price: $187.00
E11500 - SEMI E115 - Test Method for Determining the Load Impedance and Efficiency of Matching Networks Used in Semiconductor Processing Equipment RF Power Delivery Systems
E11400 - SEMI E114 - Test Method for RF Cable Assemblies Used in Semiconductor Processing Equipment RF Power Delivery Systems
E11300 - SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems
E00100 - SEMI E1 - プラスチックおよびメタルのオープンウェーハキャリアの仕様
D00900 - SEMI D9 - Terminology for FPD Substrates
SEMI D9 - Terminology for FPD Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07700 - SEMI D77 - Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method
D07600 - SEMI D76 - Test Method for Viewing Angle Characteristic Using Reference Color on Visual Displays
D07400 - SEMI D74 - Guide for Measuring Dimensions of Plastic Films/Substrates
SEMI D74 - Guide for Measuring Dimensions of Plastic Films/Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07300 - SEMI D73 - Test Method for Positional Accuracy of Capacitive Touchscreen Panel
SEMI D73 - Test Method for Positional Accuracy of Capacitive Touchscreen Panel Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07200 - SEMI D72 - Test Method for Color Properties of Electronic Paper Displays
SEMI D72 - Test Method for Color Properties of Electronic Paper Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07100 - SEMI D71 - Test Method of Tone and Color Reproduction for Flat Panel Displays
SEMI D71 - Test Method of Tone and Color Reproduction for Flat Panel Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07000 - SEMI D70 - Test Method of FPD-Based Stereoscopic Display with Passive Glasses
SEMI D70 - Test Method of FPD-Based Stereoscopic Display with Passive Glasses Sale priceMember Price: $144.00
Non-Member Price: $187.00