Individual Standards

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1215 products

G06000 - SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials
SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
G05900 - SEMI G59 - Test Method for Measurement of Ionic Contamination on Leadframe Interleafing and the Contamination Transferred from the Interleafing to the Leadframes
SEMI G59 - Test Method for Measurement of Ionic Contamination on Leadframe Interleafing and the Contamination Transferred from the Interleafing to the Leadframes Sale priceMember Price: $144.00
Non-Member Price: $187.00
G05600 - SEMI G56 - Test Method for Measurement of Silver Plating Thickness
SEMI G56 - Test Method for Measurement of Silver Plating Thickness Sale priceMember Price: $144.00
Non-Member Price: $187.00
G04200 - SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages
SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages Sale priceMember Price: $144.00
Non-Member Price: $187.00
G03800 - SEMI G38 - Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages
SEMI G38 - Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages Sale priceMember Price: $144.00
Non-Member Price: $187.00
G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages
SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages Sale priceMember Price: $144.00
Non-Member Price: $187.00
G01800 - SEMI G18 - Specification for Integrated Circuit Leadframe Material Used in the Production of Etched Leadframes
SEMI G18 - Specification for Integrated Circuit Leadframe Material Used in the Production of Etched Leadframes Sale priceMember Price: $144.00
Non-Member Price: $187.00
G09700 - SEMI G97 - Specification for Adhesive Tray Used for Thin Chip Handling
SEMI G97 - Specification for Adhesive Tray Used for Thin Chip Handling Sale priceMember Price: $144.00
Non-Member Price: $187.00
G02100 - SEMI G21 - Specification for Plating Integrated Circuit Leadframes
SEMI G21 - Specification for Plating Integrated Circuit Leadframes Sale priceMember Price: $144.00
Non-Member Price: $187.00
G04100 - SEMI G41 - Specification for Dual Strip SOIC Leadframe
SEMI G41 - Specification for Dual Strip SOIC Leadframe Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08800 - SEMI G88 - Specification for Tape Frame for 450 mm Wafer
SEMI G88 - Specification for Tape Frame for 450 mm Wafer Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08600 - SEMI G86 - Test Method for Measurement of Chip (Die) Strength by Mean of 3-Point Bending
SEMI G86 - Test Method for Measurement of Chip (Die) Strength by Mean of 3-Point Bending Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08200 - SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process
SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes
SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes Sale priceMember Price: $144.00
Non-Member Price: $187.00
G05700 - SEMI G57 - Guide for Standardization of Leadframe Terminology
SEMI G57 - Guide for Standardization of Leadframe Terminology Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07500 - SEMI G75 - Standard Test Method of the Properties of Leadframe Tape
SEMI G75 - Standard Test Method of the Properties of Leadframe Tape Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08100 - SEMI G81 - Specification for Map Data Items
SEMI G81 - Specification for Map Data Items Sale priceMember Price: $144.00
Non-Member Price: $187.00
G09200 - SEMI G92 - Specification for Tape Frame Cassette for 450 mm Wafer
SEMI G92 - Specification for Tape Frame Cassette for 450 mm Wafer Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08700 - SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer
SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07700 - SEMI G77 - Specification for Frame Cassette for 300 mm Wafers
SEMI G77 - Specification for Frame Cassette for 300 mm Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07400 - SEMI G74 - Specification for Tape Frame for 300 mm Wafers
SEMI G74 - Specification for Tape Frame for 300 mm Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G09600 - SEMI G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending
SEMI G96 - Test Method for Measurement of Chip (Die) Strength by Mean of Cantilever Bending Sale priceMember Price: $144.00
Non-Member Price: $187.00
G09500 - SEMI G95 - Specification for Mechanical Features of 450 mm Load Port for Tape Frame Cassettes in the Backend Process
SEMI G95 - Specification for Mechanical Features of 450 mm Load Port for Tape Frame Cassettes in the Backend Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
G09300 - SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法
SEMI G93 - ボール・グリッド・アレイ（BGA）パッケージ用はんだボールの測定方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
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