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2229 products

MS01200 - SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices
SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV09200 - SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules
SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules Sale priceMember Price: $144.00
Non-Member Price: $187.00
E17800 - SEMI E178 - Guide for EDA Freeze Version
SEMI E178 - Guide for EDA Freeze Version Sale priceMember Price: $144.00
Non-Member Price: $187.00
HB01200 - SEMI HB12 - Specification for Dry-Etched Patterned Sapphire Substrates (DPSS)
SEMI HB12 - Specification for Dry-Etched Patterned Sapphire Substrates (DPSS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
HB01300 - SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface
3D02200 - SEMI 3D22 - Guide on Measurements of Openings and Vias in Glass
SEMI 3D22 - Guide on Measurements of Openings and Vias in Glass Sale priceMember Price: $144.00
Non-Member Price: $187.00
C09800 - SEMI C98 - Guide for Chemical Mechanical Planarization (CMP) Particle Size Distribution (PSD) Measurement and Reporting Used in Semiconductor Manufacturing
E18000 - SEMI E180 - Test Method for Measuring Surface Metal Contamination Through ICP-MS of Critical Chamber Components Used in Semiconductor Wafer Processing
Semiconductor Manufacturing Monitor - Single Edition
Semiconductor Manufacturing Monitor Single Edition Sale priceMember Price: $1,250.00
Non-Member Price: $1,850.00
Semiconductor Manufacturing Monitor Subscription
Semiconductor Manufacturing Monitor Subscription Sale priceMember Price: $3,250.00
Non-Member Price: $4,500.00
PV09100 - SEMI PV91 - Specification for Trichlorosilane Used in Polysilicon Production
SEMI PV91 - Specification for Trichlorosilane Used in Polysilicon Production Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D02100 - SEMI 3D21 - Guide for Describing Glass-Based Material for Use in 3DS-IC Process
SEMI 3D21 - Guide for Describing Glass-Based Material for Use in 3DS-IC Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV08800 - SEMI PV88 - 惰性气体熔融红外吸收法测定光伏多晶硅中氢含量的测试方法
300mm Fab Outlook
300mm Fab Outlook Sale priceMember Price: $4,700.00
Non-Member Price: $6,900.00
E17700 - SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows
A00300 - SEMI A3 - Specification for Printed Circuit Board Equipment Communication Interfaces (PCBECI)
HB01100 - SEMI HB11 - Specification for Sapphire Single Crystal Ingot Intended for Use for Manufacturing HB-LED Wafers
G00900 - SEMI G9 - Specification for Stamped Leadframes for Plastic Molded Dual-in-Line Semiconductor Packages
G00900 - SEMI G9 - 仕様 スタンピングによる半導体プラスチックDIPパッケージ用リードフレーム
G09100 - SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog
SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog Sale priceMember Price: $144.00
Non-Member Price: $187.00
G00800 - SEMI G8 - 金めっきの試験方法
SEMI G8 - 金めっきの試験方法 Sale priceMember Price: $171.00
Non-Member Price: $180.00
G08000 - SEMI G80 - 自動試験装置の総合的デジタルタイミング精度を分析するための試験方法
G07600 - SEMI G76 - TCP用ポリイミド接着テープの仕様
SEMI G76 - TCP用ポリイミド接着テープの仕様 Sale priceMember Price: $171.00
Non-Member Price: $180.00
G07200 - SEMI G72 - ボールグリッドアレイ設計ライブラリのための仕様
SEMI G72 - ボールグリッドアレイ設計ライブラリのための仕様 Sale priceMember Price: $171.00
Non-Member Price: $180.00